100 nm-MOSFET Model for Circuit Simulation : Challenges and Solutions

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概要

• 論文の詳細を見る
• 2003-06-01

著者

• Mattausch Hans

  Research Center For Nanodevices And Systems Hiroshima University

• Morikawa Keiichi

  Semiconductor Technology Academic Research Center

• Kobayashi Akiyoshi

  Semiconductor Technology Academic Research Center

• Masuda Hiroo

  Semiconductor Technology Academic Research Center (starc)

• Masuda Hiroo

  Semiconductor Technology Academic Research Center

• Ueno Hiroaki

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• MIURA-MATTAUSCH Mitiko

  Graduate School of Advanced Science of Matter, Hiroshima University

• ITOH Satoshi

  Semiconductor Technology Academic Research Center

• Itoh Satoshi

  Semiconductor Device Engineering Laboratory Toshiba Corporation

• UENO Hiroaki

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• MATTAUSCH Hans

  Research Center for Nanodevices and Systems, Hiroshima University

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