Mn (Thin-Film)/Si (Substrate) Contacts: Analysis of the Buried Interface by Soft X-Ray Emission Spectroscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1999-01-15
著者
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Hirai M
Osaka Univ. Osaka Jpn
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Hirai M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Kusaka M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Hirai Masaaki
Research Laboratory For Surface Science Faculty Of Science Okayama University
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IWAMI Motohiro
Research Laboratory for Surface Science, Faculty of Science, Okayama University
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KUSAKA Masahiko
Research Laboratory for Surface Science, Faculty of Science, Okayama University
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WANG Jinliang
Research Laboratory for Surface Science, Faculty of Science, Okayama University
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MORII Takashi
Matsushita Research Institute Inc.
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WATABE Hirokuni
Matsushita Research Institute Inc.
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Wang J
Department Of Physics The University Of Hong Kong
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Kawai M
Surface Chemistry Laboratory
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Iwami Motohiro
Reseach Laboratory For Surface Science Faculty Of Science Okayama University
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Iwami M
Department Of Physics Faculty Of Science Hiroshima University
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Watabe Hirokuni
Matsushita Electric Industrial Co. Ltd.
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Kusaka Masahiko
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Hirai Masamitsu
Department Of Applied Physics Faculty Of Engineering Tohoku University
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Iwami M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Jinliang Wang
Research Laboratory For Surface Science Faculty Of Science Okayama University
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