Single-Molecule Imaging and Repositioning of 1,3-Butadiene Adsorbed on Pd(110) Surface
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-07-30
著者
-
Kim Yousoo
Surface Chemistry Laboratory
-
Kim Yousoo
Surface Chemistry Laboratory Riken
-
Kanai M
Inst. Physical And Chemical Res. (riken) Saitama Jpn
-
Kawai M
Riken (inst. Physical And Chemical Res.) Saitama Jpn
-
Kim Y
Lg Electronics Seoul Kor
-
Kawai Masayuki
Faculty Of Science Tokai University
-
KAWAI Maki
Surface Chemistry Laboratory
-
KOMEDA Tadahiro
Surface Chemistry Laboratory, RIKEN (The Institute of Physical and Chemical Research)
-
Komeda Tadahiro
Riken (the Institute Of Physical And Chemical Research)
-
Komeda Tadahiro
Texas Instruments Tsukuba R & D Center
-
Komeda Tadahiro
Tsukuba Research And Development Center Texas Instruments
-
Kim Y
Surface Chemistry Laboratory
-
Kawai M
Surface Chemistry Laboratory
-
Kawai M
Institute Of Molecular And Cellular Biosciences University Of Tokyo
-
Kim Y
Surface Chemistry Laboratory Riken
-
Kawai Maki
Surface Chemistry Lab. Riken (the Institute Of Physics And Chemistry Research):department Of Advance
-
Kinugasa Masanori
Research An Development Tayca Co. Ltd.
-
Kim Yongjo
Surface Chemistry Laboratory, RIKEN
-
KIM Yousoo
Surface and Interface Laboratory, RIKEN
関連論文
- Influence of Defect Segregation on the Electrical Properties of Nb-doped SrTiO_3 Grain Boundary Layer
- Direct Transport Measurements through an Ensemble of INAS Self-assembled Quantum Dots
- Electrical Properties of Electron-Beam Exposed Silicon Dioxides and Their Application to Nano-devices
- Stress-Driven Formation of InGaAs Quantum Dots on GaAs with Sub-Micron Platinum Pattern
- Free Electron Laser Oscillation down to the Deep UV Range Using a Small-Scale Storage Ring
- Lasing at 352 nm of the NIJI-IV Storage-Ring Free-Electron Laser
- Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy
- Comparison of TiN Films Deposited Using Tetrakisdimethylaminotitanium and Tetrakisdiethylaminotitanium by the Atomic Layer Deposition Method
- Compositional Variations of TiAlN Films Deposited by Metalorganic Atomic Layer Deposition Method
- Scanning Thnneling Microscopy and Near Edge X-ray Absorption Fine Structure Studies of Adsorption of Trans-2-butene on Pd(110)
- Viewing Angle Enhancement of Three-Dimension/Two-Dimension Convertible Integral Imaging Display Using Double Collimated or Noncollimated Illumination
- Maskless Selective Epitaxial Growth on Patterned GaAs Substrates by Metalorganic Chemical Vapor Deposition
- Electrical Properties of Heavily Carbon-Doped GaAs Epilayers Grown by Atmospheric Pressure Metalorganic Chemical Vapor Deposition Using CBr_4
- Laser Ablation of Alkaline Earth Metals Investigated by Time-of-Flight Mass Spectroscopy : Ion Desorption by Core-Electron Excitation
- Laser-Ablation Mechanism of Sr Metal Investigated by Time-of-Flight Mass Spectroscopy
- Growth of Oriented NiS Films on Si(111) and Al_2O_3(012) Substrate by Pulsed Laser Ablation
- Surface Diffusion and Interaction of Metastable Formate on Ni(110) Investigated by Low-temperature Scanning Tunneling Microscopy
- Characteristic Configuration of Cis-2-butene Molecule on Pd(110) Determined by Scanning Thnneling Microscopy
- Scanning Tunneling Microscopy Study of Water Molecules on Pd(110) at Cryogenic Temperature
- Single-Molecule Imaging and Repositioning of 1,3-Butadiene Adsorbed on Pd(110) Surface
- Formation and Surface Acoustic Wave Properties of LiNbO_3/AlN/Sapphire
- Effect of Ba Addition on the Properties of Bi-Pb-Sr-Ca-Cu-O Superconductors : Electrical Properties of Condensed Matter
- Strain Mechanism of LiNbO_3/Sapphire Heterostructures Grown by Pulsed Laser Deposition
- Surface Acoustic Wave Properties of Lithium Tantalate Films Grown by Pulsed Laser Deposition
- Surface Preparation, Growth, and Interface Control of Ultrathin Gate Oxides
- Simultaneous Observation of SiO_2 Surface and SiO_2/Si Interface Using Self-Assembled-Monolayer Island
- Interface States for Si-Based MOS Devices with an Ultrathin Oxide Layer : X-Ray Photoelectron Spectroscopic Measurements under Biases
- Tailored Thin Films of Superconducting Bi-Sr-Ca-Cu Oxide Prepared by Excimer Laser Ablation Technique
- Formation of the High-T_c Phase of the Superconducting Bi-Pb-Sr-Ca-Cu-O Thin Film by the Laser Ablation Method
- Comparative Study of Amorphous and Crystalline (Ba,Sr)TiO_3 Thin Films Deposited by Laser Ablation
- Ab-initio Calculation Method for Electronic Structures of Charged Surfaces Using Repeated Slab and Density-Variable Charge Sheets(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Direct Observation of Conformational Isomers of (CH_3S)_2 Molecules on Cu (111)
- Layer-by-Layer Etching of Si(111) Surface by Oxygen at Elevated Temperature
- 21aTG-8 INTERACTION BETWEEN CARBON NANOTUBES AND ORGANIC MOLECULES
- Three Different Forms of Hydrogen Molecules in Silicon
- Nano-Structure Fabrication and Manipulation by the Cantilever Oscillation of an Atomic Force Microscope
- Fabrication and Structure of Nucleic Acid Base Thin Films
- Non-destructive Analysis of Buried Interfaces and Surface Layers: X-Ray Emission Spectroscopic Study
- Valence Band Density of States of Cu_3Si Studied by Soft X-Ray Emission Spectroscopy and a First-Principle Molecular Orbital Calculation(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Study on Ti/C-teminated 4H- and 6H-SiC interface reactions by soft X-ray emission spectroscopy (SXES)
- Application of Monte Carlo Simulation to a Structural Analysis for Two-Layered/Substrate System
- Application of Monte Carlo Simulation to Structural Analysis by Soft X-Ray Emission Spectroscopy for a Silicide/Si-Bulk System
- Mn (Thin-Film)/Si (Substrate) Contacts: Analysis of the Buried Interface by Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Manganess Silicides Studied by Soft X-Ray Emission Spectroscopy
- Analysis of Heat-Treated 6H-SiC (0001) Surface Using Scanning Tunneling Microscopy
- Study of Cr Silicide Formation on Si(100) Due to Solid-Phase Reaction Using Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Iron Silicides Studied by Soft X-Ray Emission Spectroscopy
- Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides (Pt_2Si, PtSi)
- Ni-Silicide Formation : Dependence on Crystallographic Orientation of Si Substrates
- Valence Band Density of States of Palladium Silicides Studied by X-Ray Emission Spectroscopy (XES)
- Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method
- Soft X-Ray Spectroscopic Analysis of Ni-Silicides
- Hydrogen Molecules in Defective Silicon
- Formation of Hydrogen Molecules in n-Type Silicon
- Measurement of the Energy Spread of the Cold Relativistic Electron Beam Using Thomson Backscattering of a High Power CO_2 Laser
- Quench Characteristics and Operational Stability of the TOPAZ Thin Superconducting Solenoid
- Performance of the TOPAZ Thin Superconducting Solenoid Wound with Internal Winding Method
- Direct Measurement of the Energy Distribution of an Intense Relativistic Electron Beam
- AC Measurement of Seebeck Coefficient in Disk-Shaped Semiconductors Using CW-Lasers
- Excitation Spectrum of 3.39 μm Tansmission Modulation by Tunable CW-CO_2 Laser in p-Ge
- Theory of CW-Laser-Induced Dynamic Grating by Inter-Valence-Band Absorption in p-Type Semiconductors
- CW-Laser Induced Dynamic Grating and Subpicosecond Hole Relaxation Time in p-Ge
- Bi_2Sr_2Ca_1Cu_2O_8/Bi_2Sr_2Cu_1O_6 Superconducting Superlattices: Modulation of the Number of CuO_2 Plane between Bi_2O_2 Layers
- Isolation of a Cotton CAP Gene : a Homologue of Adenylyl Cyclase-Associated Protein Highly Expressed during Fiber Elongation
- Influence of Grain boundary Layers on the Dielectric Relaxation of Nb-Doped SrTiO_3
- Upright Structuring of Functional Carboxylate Anchored on Benzoate/Cu(110) Molecular Template Studied by Scanning Tunneling Microscopy
- Scaling of Three-Dimensional Integral Imaging
- High Temperature STM Observation of Layer-by-Layer Etching of Si(111) with O_2 Flux
- Nondestructive Observation of Si_Ge_/Ge/ Si_Ge_x Heterostructure Using Soft X-Ray Emission Spectroscopy
- Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy
- Valence Band Electronic State of Transition-Metal Silicide TiSi_2 Studied by Soft X-Ray Emission Spectroscopy (SXES)
- Construction of a Soft X-Ray Emission Spectroscopy (SXES) Apparatus and Its Application for Study of Electronic and Atomic Structures of a Multilayer System
- Contribution of the Si s Electronic State to the Density of State of CoSi_2 at Fermi Energy by Soft X-Ray Emission Spectroscopy
- Transmission Electron Microscopic Study of the Surface and Interface of Carbonized-Layer/Si(100)
- Self-Assembly and Scanning Tunneling Microscopy Tip-Induced Motion of Ferrocene Adamantane Trithiolate Adsorbed on Au(111)
- Epitaxial Growth of LiNbO_3 Films on Sapphire Substrates by Excimer Laser Ablation Method and Their Surface Acoustic Wave Properties
- STM and Cluster Calculation Study of Segregated B on Si(001) Surface
- Atomic Layer Control of SrCuO_x and Layer-By-Layer Growth of Bi_2Sr_2Ca_Cu_nO_ (n=1 to 5) on SrTiO_3 (100) by Laser Molecular-Beam-Epitaxy
- Epitaxial Growth and Properties of Ca_Sr_xCuO_2 Thin Film (x=0.18 to 1.0) Prepared by Co-Deposition and Atomic Layer Stacking
- Phase Control of Superconducting Bi-Sr-Ca-Cu-O Thin Films Prepared by Laser Ablation Method
- Formation of Bi-Sr-Ca-Cu-O Thin Films by a Laser Sputtering Method : Electrical Properties of Condensed Matter
- Scanning Tunneling Microscopy Observations of Benzoic Acid Molecules Coadsorbed with Single-Walled Carbon Nanotubes on Au(111) surface
- Effect of Substituent Position on Molecular Assembly: Hydrogen-Bonded Arrangement of Aminobenzoates Adsorbed on Cu(110)
- Tunneling-Electron-Induced Hopping of Methylthiolate on Cu(111)
- Direct Observation of Conformational Isomers of (CH3S)2 Molecules on Cu (111)
- Photoresponse in the Desorption of an Atomic Hydrogen on Titanium Dioxide Surface Induced by a Tip of Scanning Tunneling Microscope