Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy

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概要

• 論文の詳細を見る

• The Si L_<2,3> valence band (VB) spectrum for the Au_<0.67>Si_<0.33> alloy was first studied using the soft X-ray emission spectroscopy (SXES) technique under electron beam irradiation. A clear modification was observed in the Si L_<2,3> valence band spectrum for the Au-Si alloy of that for a Si Single crystal, which made it possible for us to discuss the Si s VB density of state (DOS). It is concluded that a significant amount of the Si(3s) originated electronic state is included in the upper half of the VB-DOS of the Au-Si alloy due to Au-Si bond formation.

• 社団法人応用物理学会の論文
• 1991-09-15

著者

• 中村 裕之

  Graduate School Of Material Science University Of Hyogo

• Hirai M

  Research Laboratory For Surface Science Faculty Of Science Okayama University

• Nakamura H

  Institute For Protein Research Osaka University

• Kusaka M

  Research Laboratory For Surface Science Faculty Of Science Okayama University

• Hirai Masaaki

  Research Laboratory For Surface Science Faculty Of Science Okayama University

• IWAMI Motohiro

  Research Laboratory for Surface Science, Faculty of Science, Okayama University

• KUSAKA Masahiko

  Research Laboratory for Surface Science, Faculty of Science, Okayama University

• WATABE Hirokuni

  Matsushita Research Institute Inc.

• NAKAMURA Hatsuo

  Osaka Electro-Communication University

• Kawai M

  Surface Chemistry Laboratory

• Iwami Motohiro

  Reseach Laboratory For Surface Science Faculty Of Science Okayama University

• Iwami M

  Department Of Physics Faculty Of Science Hiroshima University

• Watabe Hirokuni

  Matsushita Electric Industrial Co. Ltd.

• Kusaka Masahiko

  Research Laboratory For Surface Science Faculty Of Science Okayama University

• Iwami M

  Research Laboratory For Surface Science Faculty Of Science Okayama University

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