Nondestructive Observation of Si_<0.5>Ge_<0.5>/Ge/ Si_<1-x>Ge_x Heterostructure Using Soft X-Ray Emission Spectroscopy
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-09-15
著者
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中村 裕之
Graduate School Of Material Science University Of Hyogo
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Hirai M
Osaka Univ. Osaka Jpn
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Hirai M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Nakamura H
Institute For Protein Research Osaka University
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Kusaka M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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NAKAGAWA Kiyokazu
Central Research Laboratory, Hitachi Ltd.
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Hirai Masaaki
Research Laboratory For Surface Science Faculty Of Science Okayama University
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IWAMI Motohiro
Research Laboratory for Surface Science, Faculty of Science, Okayama University
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KUSAKA Masahiko
Research Laboratory for Surface Science, Faculty of Science, Okayama University
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NAKAMURA Hatsuo
Osaka Electro-Communication University
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Kawai M
Surface Chemistry Laboratory
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Iwami Motohiro
Reseach Laboratory For Surface Science Faculty Of Science Okayama University
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Iwami M
Department Of Physics Faculty Of Science Hiroshima University
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Kusaka Masahiko
Research Laboratory For Surface Science Faculty Of Science Okayama University
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Iwami M
Research Laboratory For Surface Science Faculty Of Science Okayama University
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MURAKAMI Eiichi
Central Research Laboratory, Hitachi, Ltd.
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Murakami Eiichi
Central Research Laboratory Hitachi Ltd.
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Nakagawa Kiyokazu
Central Research Laboratory Hitachi Ltd.
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NAKAGAWA Kiyokazu
Central Research Laboratory, Hitachi, Ltd.
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