Influences of Dark Line Defects on Characteristics of AlGaAs/GaAs Quantum Well Lasers Grown on Si Substrates

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1995-06-15

著者

• JIMBO Takashi

  Research Center for Micro-Structure Device, Nagoya Institute of Technology

• UMENO Masayoshi

  Department of electrical and Computer Engineering, Nagoya Institute of Technology

• EGAWA Takashi

  Research center for Nano-Device and System, Nagoya Institute of Technology

• Umeno M

  Department Of Electronic Engineering Chubu University

• Umeno Masayoshi

  Department Of Electric And Computer Engineering Nagoya Institute Of Technology

• Egawa Takashi

  Research Center For Nano-device And System Nagoya Institute Of Technology

• Umeno Masataka

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Hasegawa Y

  Asahi Technical Lab. Co. Shizuoka Jpn

• Hasegawa Yoshiaki

  Department Of Periodontology School Of Dentistry Aichi-gakuin University

• Umeno M

  Nagoya Inst. Technology

• Egawa Takashi

  Research Center for Micro-Structure Devices, Nagoya Institute of Technology

• Hasegawa Yoshiaki

  Department of Environmental Technology and Urban Planning, Nagoya Institute of Technology

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