Influence of P Content in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Zn Solder and Plated Au/Ni-P Alloy Film

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概要

• 論文の詳細を見る
• Japan Institute of Metalsの論文
• 2002-08-01

著者

• ONUKI Jin

  Department of Materials Science and Engineering, Ibaraki University

• Onuki Jin

  Akita Prefectural University

• Koizumi M

  Department Of Electronics And Information Systems Faculty Of Systems Science And Technology Akita Pr

• Onuki J

  Dep. Of Materials Sci. And Engineering Ibaraki Univ.

• Onuki J

  Akita Prefectural Univ. Honjo Jpn

• Onuki Jin

  Department Of Electronic And Information Systems Faculty Of Systems Science And Technology Akita Pre

• Nishida Takashi

  Central Research Laboratory Hitachi Ltd.

• KOMIYAMA Takao

  Department of Electronics and Information Systems, Faculty of Systems Science and Technology, Akita

• CHONAN Yasunori

  Department of Electronics and Information Systems, Faculty of Systems Science and Technology, Akita

• Komiyama Takao

  Department Of Electronic And Information Systems Faculty Of Systems Science And Technology Akita Pre

• Nagano Tomohiro

  Department Of Physics Faculty Of Sciense And Technology Science University Of Tokyo

• URAO Ryoichi

  Department of Materials Science, Faculty of Engineering, Ibaraki University

• NAGANO Takahiro

  Hitachi Central Research Laboratory, Hitachi Ltd.

• Chonan Yasunori

  Department Of Electronics And Information System Faculty Of System Science And Technology Akita Pref

• Urao Ryoichi

  Department Of Materials Science Faculty Of Engineering Ibaraki University

• Nagano Takahiro

  Semiconductor And Integrated Circuits Division Hitachi Ltd.

関連論文

• Impact of High Heating Rate, Low Temperature, and Short Time Annealing on the Realization of Low Resistivity Cu Wire
• Enhanced Degradation During Static Stressing of a Metal Oxide Semiconductor Field Effect Transistor Embedded in a Circuit
• A 6.93-μm^2 Full CMOS SRAM Cell Technology for 1.8-V High-Performance Cache Memory
• Large 1/f Noise in Polysilicon TFT Loads and its Effects on the Stability of SRAM Cells
• Large 1/f Noise in Polysilicon TFT Loads and Its Effects on the Stability of SRAM Cells
• A 6-ns 4-Mb CMOS SRAM with Offset-Voltage-Insensitive Current Sense Amplifiers(Special Issue on the 1994 VLSI Circuits Symposium)
• High-Temperature Thick Al Wire Bonding Technology for High-Power Modules
• High-Strength and High-Speed Bonding Technology using Thick Al-Ni Wire
• Development of A New High-Frequency, High-Peak Current Power Source for High Constricted Arc Formation
• Molecular Dynamics Simulation of Grain Growth of Cu Film : Effects of Adhesion Strength between Substrate and Cu Atoms
• Molecular Dynamics Simulation of Void Generation during Annealing of Copper Wiring
• Joining of Oxide Dispersion Strengthened Ni Based Super Alloys
• Influence on the Electro-Migration Resistance by Line Width and Average Grain Size along the Longitudinal Direction of Very Narrow Cu Wires
• Microstructures of 50-nm Cu Interconnects along the Longitudinal Direction
• Influence of Grain Size Distributions on the Resistivity of 80nm Wide Cu Interconnects
• Aspect ratio dependence of the resistivity of fine line Cu interconnects
• Filling a Narrow and High Aspect-Ratio Trench with Electro-Cu Plating
• Filling 80-nm-Wide and High-Aspect-Ratio Trench with Pulse Wave Copper Electroplating and Observation of the Microstructure
• Improvement of the Surface Layer of Steel Using Microwave Plasma Nitriding
• Microwave Plasma Nitriding of Hollow Tube Inner Wall
• The Low Temperature Bonding between Si and Electrode Using Sputtered Ag Films
• Influence of P Content in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Zn Solder and Plated Au/Ni-P Alloy Film
• Influence of Phosphorus Concentration in Electroless Plated Ni-P Alloy Film on Interfacial Structures and Strength between Sn-Ag-(-Cu) Solder and Plated Ni-P Alloy Film
• Influence of Soldering Conditions on Void Formation in Large-area Solder Joints
• The Influence of Phosphorus Concentration of Electroless Plated Ni-P Film on Interfacial Structures in the Joints between Sn-Ag Solder and Ni-P Alloy Film
• A Void Free Soldering Process in Large-Area, High Power Insulated Gate Bipolar Transistor Modules
• Reliability Enhancement of Solder Joints Made by a Void Free Soldering process
• Interface Reaction between Solder and Plated Nickel Film
• Effect of Physical Properties of Al–Si Electrode Films on the Deformation Behaviors and the Strength of Thick Al Wire Bonds during Thermal Cycle Test
• Determination of the Phase-Field Parameters for Computer Simulation of Heat Treatment Process of Ultra Thin Al Film
• High Expression of the Second Lysine Decarboxylase Gene, ldc, in Escherichia coli WC196 Due to the Recognition of the Stop Codon (TAG), at a Position Which Corresponds to the 33th Amino Acid Residue of σ^, as a Serine Residue by the Amber Suppressor,
• RpoS-Dependent Expression of the Second Lysine Decarboxylase Gene in Escherichia coli
• ^V and ^Mn Hyperfine Fields in the L2_1-Type Fe_2Mn_V_xSi and Fe_2T_Cr_xSi (T=V, Mn) Compounds
• Investigation of Low Loss and High Reliability Encapsulation Technology in Large-Area, High-Power Semiconductor Devices
• Computer Simulation of Silicon Nanoscratch Test
• A 5-mW, 10-ns Cycle TLB Using a High-Performance CAM with Low-Power Match-Detection Circuits (Special Issue on ULSI Memory Technology)
• Friction and Elongation of Al Electrodes due to Micro-Sliding between the Inner Mo Electrode and the Al Electrodes in High-Power Devices
• 多結晶銅薄膜の粒成長に及ぼす不純物の影響
• Effect of Additive-Free Plating and High Heating Rate Annealing on the Formation of Low Resistivity Fine Cu Wires
• PREFACE
• Reliability Enhancement of Thick Al-Cu Wire Bonds in IGBT Modules Using Al_2Cu Precipitates
• Void Generation Mechanism in Cu Filling Process by Electroplating for Ultra Fine Wire Trenches
• Aspect Ratio Dependence of the Resistivity of Fine Line Cu Interconnects
• Filling 80-nm-Wide and High-Aspect-Ratio Trench with Pulse Wave Copper Electroplating and Observation of the Microstructure
• Large 1/f Noise in Polysilicon TFT Loads and its Effects on the Stability of SRAM Cells
• Coating Adhesion Evaluation by Nanoscratching Simulation Using the Molecular Dynamics Method
• Observation of Microstructures in the Longitudinal Direction of Very Narrow Cu Interconnects
• Influence of Minimum Barrier Metal Thickness at Trenches on Void Formation in 50-nm-wide Cu Wiring
• ナノスケールダマシン銅配線のアニーリングによる構造変化

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