Large 1/f Noise in Polysilicon TFT Loads and its Effects on the Stability of SRAM Cells
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概要
- 論文の詳細を見る
- 1996-02-01
著者
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Aoki Masaaki
Central Research Laboratory Hitachi Ltd.
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Nishida Takashi
Central Research Laboratory Hitachi Ltd.
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YAMANAKA Toshiaki
Central Research Laboratory, Hitachi, Ltd.
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NAGANO Takahiro
Semiconductor and Integrated Circuits Division, Hitachi, Ltd.
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HASHIMOTO Takashi
Semiconductor and Integrated Circuits Division, Hitachi, Ltd.
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- Large 1/f Noise in Polysilicon TFT Loads and its Effects on the Stability of SRAM Cells