Spatial Distributions of Individual Traps in a Si/SiO_2 Interface

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概要

• 論文の詳細を見る
• 1996-08-26

著者

• SAKAMOTO Tetsuo

  Institute of Industrial Science, The University of Tokyo

• SAKAMOTO Toshitsugu

  NEC Fundamental Research Laboratories

• Sakamoto Toshitugu

  Faculty Of Engineering Science Osaka University

• Baba T

  Fundamental Research Laboratories Nec Corporation:(present Office)silicon System Laboratories Nec Co

• Shiokawa Takao

  Semiconductor Laboratory Riken The Institute For Physical And Chemical Research

• Sakamoto T

  Department Of Communication Engineering Faculty Of Computer Science And System Engineering Okayama P

• Kawaura H

  Fundamental Research Laboratories Nec Caporation

• KAWAURA Hisao

  NEC Fundamental Research Laboratories

• BABA Toshio

  NEC Fundamental Research Laboratories

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