Shiokawa Takao | Semiconductor Laboratory Riken The Institute For Physical And Chemical Research

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著作論文

Effect of Fermi Level Motion on the Optical, ESR and Transport Properties of CuInSe_2
ESR and Optical Studies of CuInS_2 Single Crystals
Growth of Ultrathin Silver Films by Excimer-Laser-Induced Decomposition of Silver Acetate in Air
Excimer-Laser Removal of SiO_2 Patterns from GaAs Substrates
Calixarene Electron Beam Resist for Nano-Lithography
Low-Energy Ion-Beam Irradiation Effects on Two-Dimensional Electron Gas in Modulation-Doped AlGaAs/ GaAs Heterostructure : Micro/nanofabrication and Devices
Low-Energy Ion-Beam Irradiation Effects on Two-Dimensional Electron Gas in Modulation-Doped AlGaAs/GaAs Heterostructure
Fabrication of Periodic Structures in GaAs by Focused-Ion-Beam Implantation : Microfabrication and Physics
Fabrication of Periodic Structures in GaAs by Focused-Ion-Beam Implantation
40 nm Width Structure of GaAs Fabricated by Fine Focused Ion Beam Lithography and Chlorine Reactive Ion Etching : Techniques, Instrumentations and Measurement
FIB Exposure Characteristics of LB Film
Ridge Type Microfabrication by Maskless Ion Implantation of Si into SiO_2 Film
A Novel Fabrication Method for Polycrystalline Silicon Thin-Film Transistors with a Self-Aligned Lightly Doped Drain Structure
Supercritical Fluid Clean-Up of Environmental Samples for the Analysis of Polycyclic Aromatic Hydrocarbons Using Time-of-Flight Secondary Ion Mass Spectrometry
Maskless Etching of AN Using Focused Ion Beam
Maskless Ion Beam Assisted Etching of Si Using Chlorine Gas
Abrupt Si/Ge/Si(001) Interfaces Fabricated with Bi as a Surfactant
Which Surfactant Shall We Choose for the Heteroepitaxy of Ge/Si(001)? : Bi as a Surfactant with Small Self-Incorporation
Structure and Resonant Characteristics of Amorphous Carbon Pillars Grown by Focused-Ion-Beam-Induced Chemical Vapor Deposition
Formation and Characterization of Thin Oxide Layers on the Spatially Controlled Atomic-Step-Free Si(001) Surface
Formation and Characterization of Thin Oxide Layers on the Spatially Controlled Atomic-Step-Free Si(001) Surface
Spatially Controlled Formation of an Atomically Flat Si(001) Surface by Annealing with a Direct Current in an Ultrahigh Vacuum
Spatially Controlled Formation of Atomically Flat Si(001) Surface by Annealing with a Direct Current in UHV
Observation of Direct Band Gap Properties in Ge_nSi_m Strained-Layer Superlattices
Nonlinear Dynamics in Directly Modulated Self-Pulsating Laser Diodes with a Highly Doped Saturable Absorption Layer(Optics and Quantum Electronics)
Stability of Optical Dynamic Memory Operation under Period-Two State of Chaotic System
Observation of 77 K Staircase I-V Characteristics in 2DEG's Irradiated by a Focused Ion Beam
Single Electron Digital Phase Modulator
Electron Focusing in a Widely Tapered Cross Junction
Silicon nano-scale devices
Single-Electron Memory Fabricated from Doped Silicon-on-Insulator Film
Hot Electron Transport in Si-MOSFETs
Transport Properties in Sub-10-nm-gate EJ-MOSFETs
Si In-Plane Floating-Dot Memory with a Single Electron Transistor
Fabrication and Characterization of 14-nm-Gate-Length EJ-MOSFETs
Proposal of Pseudo Source and Drain MOSFETs for Evaluating 10-nm Gate MOSFETs
Spatial Distributions of Individual Traps in a Si/SiO_2 Interface
Spatial Distributions of Individual Traps in a Si/SiO_2 Interface
Maskless Ion Implantation of Cerium by Focused Ion Beam : Techniques, Instrumentations and Measurement
Development of an Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry
Maskless Submicrometer Pattern Formation of Cr Films by Focused Sb Ion Implantation

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