Microstructure of CoCr Thin Films Prepared by Sputtering
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1985-06-20
著者
-
Honda Y
Department Of Electronics Nagoya University
-
Honda Yoshio
Department Of Electronics School Of Engineering Nagoya University Chikusa-ku Nagoya
-
KAKIBAYASHI Hiroshi
Central Research Laboratory, Hitachi Ltd.
-
HONDA Yukio
Central Research Laboratory, Hitachi Ltd.
-
FUTAMOTO Masaaki
Central Research Laboratory, Hitachi Ltd.
-
Honda Yoshio
Department Of Electronics Nagoya University
-
Honda Y
Tsukuba Research Laboratory Sumitomo Chemical Co. Ltd.
-
SHIMOTSU Teruho
Central Research Laboratory, Hitachi Ltd.
-
UESAKA Yasutarou
Central Research Laboratory, Hitachi Ltd.
-
Honda Yukio
Central Research Laboratory Hitachi Ltd.
-
KAKIBAYASHI Hiroshi
The authors are with Central Research Laboratory, Hitachi Ltd.
-
Uesaka Yasutarou
Central Research Laboratory Hitachi Ltd.
-
Shimotsu Teruho
Central Research Laboratory Hitachi Ltd.
-
Futamoto M
Hitachi Ltd. Kokubunji‐shi Jpn
-
Futamoto Masaaki
Central Research Laboratory Hitachi Ltd.
-
Kakibayashi H
Hitachi Ltd. Tokyo Jpn
-
Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd
関連論文
- Selective Growth of GaN/AlGaN Microstructures by Metalorganic Vapor Phase Epitaxy
- Selective Area Growth of GaN on Si Substrate Using SiO_2 Mask by Metalorganic Vapor Phase Epitaxy
- Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AIGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate : Structure and Machanical and Thermal Properties of Condensed Matter
- Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope
- Scintigraphic Detection of Regional Disruption of the Adrenergic Nervous System in Sarcoid Heart disease
- A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
- Transmission Electron Microscopy Investigation of Dislocations in GaN Layer Grown by Facet-Controlled Epitaxial Lateral Overgrowth : Semiconductors
- Crystalline and Optical Properties of ELO GaN by HVPE Using Tungsten Mask(Special Issue on Blue Laser Diodes and Related Devices/Technologies)
- Crystal Orientation Fluctuation of Epitaxial-Lateral-Overgrown GaN with W Mask and SiO_2 Mask Observed by Transmission Electron Diffraction and X-Ray Rocking Curves
- Structure of Self-Assembled Monolayers from Amphiphilic Diacetylene Derivatives on Indium-Tin Oxide
- Alignment of Surface-Stabilized Ferroelectric Liquid Crystal by the Self-Assembled Monolayers of Amphiphilic Diacetylene Derivatives
- Continuous-Wave Operation of a Lateral Current Injection Ridge Waveguide AlGaAs/GaAs Laser with a Selectively-Doped Heterostructure
- In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces : Beam-Induced Physics and Chemistry
- In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces
- Incidence Angle Dependence in Hydrogen Plasma Processing of Semiconductor Surfaces : Beam Induced Physics and Chemistry
- Al-Pd-Re Icosahedral Quasicrystals and Their Low Electrical Conductivities
- Toward Insulating Quasicrystalline Alloy in Al-Pd-Re Icosahedral Phase
- Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs / AlGaAs Superstructure
- Distortion of Electron-Beam-Recorded Patterns on a Photographic Plate due to Charge-Up
- Electrical Transport Properties of Al-Cu-Os Icosahedral Quasicrystal
- Recorded Magnetization Structures and Noise Characteristics of CoCr Alloy Longitudinal Thin-Film Media
- Phase Controlled Scanning Force Microscope
- High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
- Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
- Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
- Magnetic and Microstructural Properties of Co-Cr Film Fabricated by Continuous Roll Coater : Magnetism, Magnetic Materials Devices
- Observation of Magnetization Structure on Co-Cr Perpendicular Magnetic Recording Media by Bitter and Electron Holography Methods
- Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
- Microstructure of CoCr Thin Films Prepared by Sputtering
- Surface Analysis of LaB_6 Single Crystal Thermionic Emitters
- Microstructure of Visible Light Emitting Porous Silicon
- Direct Observation of a-Si:H/a-Si_C_x:H Multilayers and Their Electrical Properties : Surfaces, Interfaces and Films
- Effects of Carbon Intermediate Layer on Structural and Magnetic Properties of Double-Layered Perpendicular Magnetic Recording Media(Special Issue on Recent Progress in Information Storage Technology)
- Effect of Nonmagnetic Underlayer on Structural and Magnetic Properties of CoCr-Alloy Thin Film Media(Special Issue on Selected Papers from the 5th Asian Symposium on Information Storage Technology)
- Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type
- Realization of 52.5 Gb/in^2 Perpendicular Recording
- MR2000-11 Realization of 52.5 Gb/in^2 Perpendicular Recording
- Monoclonal Antibody #3-9-16 Recognizes One of the Two Isoforms of Rabies Virus Matrix Protein That Exposes Its N-Terminus on the Virion Surface
- Preparation and Characterization of (0001)-Oriented Single-Crystal Co-alloy Magnetic Thin Films(Special Issue on Recent Progress in Information Storage Technology)
- Torque Measurements of Ferromagnetic Mn-Al Multilayered Films
- Magnetic Properties of Mn-Al Multilayered Films
- Spectrum Analysis of Recorded Magnetization Using Magnetic Force Microscopy
- Hetero-Epitaxial PbZr_Ti_O_3 Capacitors with Oxide Electrodes(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)
- Current Status and Future Trend of Analytical Instruments for Failure Analyses in Si Process
- Fine Chromium Grating Directly Made by Irradiating Electron Beam
- Highly Accurate Composition Analysis of (Pb, Zr)TiO_3 Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer
- Reduction of Efficiency Droop in Semipolar $(1\bar{1}01)$ InGaN/GaN Light Emitting Diodes Grown on Patterned Silicon Substrates
- Comparison of Relaxation Process of Compressive and Tensile Strains in InGaAs Lattice-Mismatched Layers on InP Substrates
- Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images
- High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM
- Direct Observation of Strain Distribution in InP/In_Ga_xP Heterointerfaces by the Compositional Analysis by Thickness Fringe Method
- Phase-Hologram Fabrication with a Computer-Controlled Electron Beam
- Effects of Alloying Element in Cr-based Underlayer on Magnetic Properties of Co-Cr-Pt Media (第4回アジア情報記録技術シンポジウム)
- Change of Apparent Sensitivity of an Electron Resist Due to Backing Materials
- Preparation of YBa_2Cu_3O_ Thin Films by Heat-Oxidation of Vacuum-Deposited Multilayer Metallic Films : Electrical Properties of Condensed Matter
- Electron-beam-induced-current investigation of GaN/AlGaN/Si heterostructures using scanning transmission electron microscopy
- Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure
- Observation of Fine Compositional Fluctuation in GaAs/AI_xGa_As Superstructure Using Composition Analysis by Thickness-Fringe (CAT) Method
- Three-dimensional STEM for observing nanostructures
- Single Crystal Growth of Lanthanum Hexaboride in Molten Aluminium
- Position Alignment in Algebraic Reconstruction Method by Using Center of Gravity
- Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
- Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
- Fine Structure of Crack in Yttrium Oxide and Aluminum Oxide Fluxed Silicon Nitride
- Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current
- Influence of Substrate Misorientation on Surface Morphology of Be-Doped GaAs Grown by MBE
- Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_ As Multilayer Structure
- Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/ Al_xGa_As Superstructure
- Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
- New Structure on TiN(001) Cleaved Surfaces
- Depth Profiling of Superstructures by μ-AES Utilizing Angle-Lapped Specimens: Techniques, Instrumentations and Measurement
- Detection of Strain in InP/InGaP Superlattices by Dark-Field Electron Microscopy and Nano-Diffraction Technique
- Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy
- Chemical and Electrolytic Reaction between LaB_6 Rods and HNO_3 Aqueous Solution
- Effects of Alloying Element in Cr-based Underlayer on Magnetic Properties of Co-Cr-Pt Media
- Microstructures of Co/Cr Bilayer Films Epitaxially Grown on MgO Single-Crystal Substrates
- Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
- Effects of Alloying Element in Cr-Based Underlayer on Magnetic Properties of Co-Cr-Pt Media(Special Issue on Selected Papers from the 4th Asian Symposium for Information Storage Technology)
- Series Resistance in n-GaN/AlN/n-Si Heterojunction Structure
- AlGaN-Based Deep Ultraviolet Light-Emitting Diodes Fabricated on Patterned Sapphire Substrates
- Crystallographic Properties of LaB_6 Formed in Molten Aluminium
- Substrate Misorientation Effect on Be Transport during MBE Growth of GaAs