Phase Controlled Scanning Force Microscope

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1994-09-01

著者

• Honda Y

  Department Of Electronics Nagoya University

• Honda Yoshio

  Department Of Electronics School Of Engineering Nagoya University Chikusa-ku Nagoya

• Honda Y

  Tokyo Inst. Technol. Tokyo Jpn

• Hosaka S

  Hitachi Ltd. Tokyo Jpn

• Hosaka Sumio

  Advanced Research Laboratory Hitachi Ltd.

• Hosaka S

  Gunma Univ. Kiryu Jpn

• HONDA Yukio

  Central Research Laboratory, Hitachi Ltd.

• Honda Yoshio

  Department Of Electronics Nagoya University

• Honda Y

  Hitachi Ltd. Kokubunji‐shi Jpn

• Honda Y

  Tsukuba Research Laboratory Sumitomo Chemical Co. Ltd.

• Kikukawa A

  Hitachi Ltd. Tokyo Jpn

• Kikukawa Atsushi

  Central Research Laboratory Hitachi Ltd.

• Kikukawa Atsushi

  Advanced Research Laboratory Hitachi Ltd.

• IMURA Ryo

  Advanced Research Laboratory, Hitachi Ltd.

• Imura Ryo

  Advanced Research Laboratory Hitachi Ltd.

• Honda Yukio

  Central Research Laboratory Hitachi Ltd.

• IMURA Ryo

  Advanced Research Institute, Hitachi Ltd.

関連論文

• Selective Growth of GaN/AlGaN Microstructures by Metalorganic Vapor Phase Epitaxy
• Selective Area Growth of GaN on Si Substrate Using SiO_2 Mask by Metalorganic Vapor Phase Epitaxy
• Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AIGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate : Structure and Machanical and Thermal Properties of Condensed Matter
• Scintigraphic Detection of Regional Disruption of the Adrenergic Nervous System in Sarcoid Heart disease
• In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
• Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
• A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
• Transmission Electron Microscopy Investigation of Dislocations in GaN Layer Grown by Facet-Controlled Epitaxial Lateral Overgrowth : Semiconductors
• Crystalline and Optical Properties of ELO GaN by HVPE Using Tungsten Mask(Special Issue on Blue Laser Diodes and Related Devices/Technologies)
• Crystal Orientation Fluctuation of Epitaxial-Lateral-Overgrown GaN with W Mask and SiO_2 Mask Observed by Transmission Electron Diffraction and X-Ray Rocking Curves
• Structure of Self-Assembled Monolayers from Amphiphilic Diacetylene Derivatives on Indium-Tin Oxide
• Alignment of Surface-Stabilized Ferroelectric Liquid Crystal by the Self-Assembled Monolayers of Amphiphilic Diacetylene Derivatives
• Continuous-Wave Operation of a Lateral Current Injection Ridge Waveguide AlGaAs/GaAs Laser with a Selectively-Doped Heterostructure
• In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces : Beam-Induced Physics and Chemistry
• In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces
• Incidence Angle Dependence in Hydrogen Plasma Processing of Semiconductor Surfaces : Beam Induced Physics and Chemistry
• Al-Pd-Re Icosahedral Quasicrystals and Their Low Electrical Conductivities
• Toward Insulating Quasicrystalline Alloy in Al-Pd-Re Icosahedral Phase
• Atomic Force Microscopy for High Aspect Ratio Structure Metrology
• XY-Stage-Based Electron-Beam Recorder for the Single-Carrier Independent Pit-Edge Recording Radial Partial Response Format
• Distortion of Electron-Beam-Recorded Patterns on a Photographic Plate due to Charge-Up
• Electrical Transport Properties of Al-Cu-Os Icosahedral Quasicrystal
• Recorded Magnetization Structures and Noise Characteristics of CoCr Alloy Longitudinal Thin-Film Media
• Phase Controlled Scanning Force Microscope
• High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
• Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
• Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
• Magnetic and Microstructural Properties of Co-Cr Film Fabricated by Continuous Roll Coater : Magnetism, Magnetic Materials Devices
• Observation of Magnetization Structure on Co-Cr Perpendicular Magnetic Recording Media by Bitter and Electron Holography Methods
• Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
• Microstructure of CoCr Thin Films Prepared by Sputtering
• Effects of Carbon Intermediate Layer on Structural and Magnetic Properties of Double-Layered Perpendicular Magnetic Recording Media(Special Issue on Recent Progress in Information Storage Technology)
• Effect of Nonmagnetic Underlayer on Structural and Magnetic Properties of CoCr-Alloy Thin Film Media(Special Issue on Selected Papers from the 5th Asian Symposium on Information Storage Technology)
• Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
• Depth and State Analyses of Deuterium and Helium in D_2-Annealed He^+-Implanted Yttrium Iron Garnet
• Monoclonal Antibody #3-9-16 Recognizes One of the Two Isoforms of Rabies Virus Matrix Protein That Exposes Its N-Terminus on the Virion Surface
• A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
• Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
• Spectrum Analysis of Recorded Magnetization Using Magnetic Force Microscopy
• Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
• Fine Chromium Grating Directly Made by Irradiating Electron Beam
• Reduction of Efficiency Droop in Semipolar $(1\bar{1}01)$ InGaN/GaN Light Emitting Diodes Grown on Patterned Silicon Substrates
• Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
• New Edge-Shift Detection Method for Write Strategy Optimization in High-Density Optical Disc Recording
• Pulsed-to-Continuous Read Signal Converter for Increasing Read Signal-to-Noise Ratio
• Phase-Hologram Fabrication with a Computer-Controlled Electron Beam
• Change of Apparent Sensitivity of an Electron Resist Due to Backing Materials
• Preparation of YBa_2Cu_3O_ Thin Films by Heat-Oxidation of Vacuum-Deposited Multilayer Metallic Films : Electrical Properties of Condensed Matter
• Electron-beam-induced-current investigation of GaN/AlGaN/Si heterostructures using scanning transmission electron microscopy
• Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure
• Single Crystal Growth of Lanthanum Hexaboride in Molten Aluminium
• Series Resistance in n-GaN/AlN/n-Si Heterojunction Structure
• AlGaN-Based Deep Ultraviolet Light-Emitting Diodes Fabricated on Patterned Sapphire Substrates
• Read Data Transfer Rate Estimation in Optical Phase Multilevel Recording (Special Issue : Optical Memories)
• Analysis of Signal-to-Noise Ratio Improvement by Multi-tone Demodulation
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

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