Phase Controlled Scanning Force Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-09-01
著者
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Honda Y
Department Of Electronics Nagoya University
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Honda Yoshio
Department Of Electronics School Of Engineering Nagoya University Chikusa-ku Nagoya
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Honda Y
Tokyo Inst. Technol. Tokyo Jpn
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Hosaka S
Hitachi Ltd. Tokyo Jpn
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Hosaka Sumio
Advanced Research Laboratory Hitachi Ltd.
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Hosaka S
Gunma Univ. Kiryu Jpn
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HONDA Yukio
Central Research Laboratory, Hitachi Ltd.
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Honda Yoshio
Department Of Electronics Nagoya University
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Honda Y
Hitachi Ltd. Kokubunji‐shi Jpn
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Honda Y
Tsukuba Research Laboratory Sumitomo Chemical Co. Ltd.
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Kikukawa A
Hitachi Ltd. Tokyo Jpn
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Kikukawa Atsushi
Central Research Laboratory Hitachi Ltd.
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Kikukawa Atsushi
Advanced Research Laboratory Hitachi Ltd.
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IMURA Ryo
Advanced Research Laboratory, Hitachi Ltd.
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Imura Ryo
Advanced Research Laboratory Hitachi Ltd.
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Honda Yukio
Central Research Laboratory Hitachi Ltd.
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IMURA Ryo
Advanced Research Institute, Hitachi Ltd.
関連論文
- Selective Growth of GaN/AlGaN Microstructures by Metalorganic Vapor Phase Epitaxy
- Selective Area Growth of GaN on Si Substrate Using SiO_2 Mask by Metalorganic Vapor Phase Epitaxy
- Transmission Electron Microscopy Study of the Microstructure in Selective-Area-Grown GaN and an AIGaN/GaN Heterostructure on a 7-Degree Off-Oriented (001) Si Substrate : Structure and Machanical and Thermal Properties of Condensed Matter
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- Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
- A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
- Transmission Electron Microscopy Investigation of Dislocations in GaN Layer Grown by Facet-Controlled Epitaxial Lateral Overgrowth : Semiconductors
- Crystalline and Optical Properties of ELO GaN by HVPE Using Tungsten Mask(Special Issue on Blue Laser Diodes and Related Devices/Technologies)
- Crystal Orientation Fluctuation of Epitaxial-Lateral-Overgrown GaN with W Mask and SiO_2 Mask Observed by Transmission Electron Diffraction and X-Ray Rocking Curves
- Structure of Self-Assembled Monolayers from Amphiphilic Diacetylene Derivatives on Indium-Tin Oxide
- Alignment of Surface-Stabilized Ferroelectric Liquid Crystal by the Self-Assembled Monolayers of Amphiphilic Diacetylene Derivatives
- Continuous-Wave Operation of a Lateral Current Injection Ridge Waveguide AlGaAs/GaAs Laser with a Selectively-Doped Heterostructure
- In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces : Beam-Induced Physics and Chemistry
- In-Situ RHEED Monitoring of Hydrogen Plasma Cleaning on Semiconductor Surfaces
- Incidence Angle Dependence in Hydrogen Plasma Processing of Semiconductor Surfaces : Beam Induced Physics and Chemistry
- Al-Pd-Re Icosahedral Quasicrystals and Their Low Electrical Conductivities
- Toward Insulating Quasicrystalline Alloy in Al-Pd-Re Icosahedral Phase
- Atomic Force Microscopy for High Aspect Ratio Structure Metrology
- XY-Stage-Based Electron-Beam Recorder for the Single-Carrier Independent Pit-Edge Recording Radial Partial Response Format
- Distortion of Electron-Beam-Recorded Patterns on a Photographic Plate due to Charge-Up
- Electrical Transport Properties of Al-Cu-Os Icosahedral Quasicrystal
- Recorded Magnetization Structures and Noise Characteristics of CoCr Alloy Longitudinal Thin-Film Media
- Phase Controlled Scanning Force Microscope
- High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
- Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
- Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
- Magnetic and Microstructural Properties of Co-Cr Film Fabricated by Continuous Roll Coater : Magnetism, Magnetic Materials Devices
- Observation of Magnetization Structure on Co-Cr Perpendicular Magnetic Recording Media by Bitter and Electron Holography Methods
- Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
- Microstructure of CoCr Thin Films Prepared by Sputtering
- Effects of Carbon Intermediate Layer on Structural and Magnetic Properties of Double-Layered Perpendicular Magnetic Recording Media(Special Issue on Recent Progress in Information Storage Technology)
- Effect of Nonmagnetic Underlayer on Structural and Magnetic Properties of CoCr-Alloy Thin Film Media(Special Issue on Selected Papers from the 5th Asian Symposium on Information Storage Technology)
- Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
- Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
- Depth and State Analyses of Deuterium and Helium in D_2-Annealed He^+-Implanted Yttrium Iron Garnet
- Monoclonal Antibody #3-9-16 Recognizes One of the Two Isoforms of Rabies Virus Matrix Protein That Exposes Its N-Terminus on the Virion Surface
- A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
- Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
- Spectrum Analysis of Recorded Magnetization Using Magnetic Force Microscopy
- Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
- Fine Chromium Grating Directly Made by Irradiating Electron Beam
- Reduction of Efficiency Droop in Semipolar $(1\bar{1}01)$ InGaN/GaN Light Emitting Diodes Grown on Patterned Silicon Substrates
- Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
- New Edge-Shift Detection Method for Write Strategy Optimization in High-Density Optical Disc Recording
- Pulsed-to-Continuous Read Signal Converter for Increasing Read Signal-to-Noise Ratio
- Phase-Hologram Fabrication with a Computer-Controlled Electron Beam
- Change of Apparent Sensitivity of an Electron Resist Due to Backing Materials
- Preparation of YBa_2Cu_3O_ Thin Films by Heat-Oxidation of Vacuum-Deposited Multilayer Metallic Films : Electrical Properties of Condensed Matter
- Electron-beam-induced-current investigation of GaN/AlGaN/Si heterostructures using scanning transmission electron microscopy
- Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure
- Single Crystal Growth of Lanthanum Hexaboride in Molten Aluminium
- Series Resistance in n-GaN/AlN/n-Si Heterojunction Structure
- AlGaN-Based Deep Ultraviolet Light-Emitting Diodes Fabricated on Patterned Sapphire Substrates
- Read Data Transfer Rate Estimation in Optical Phase Multilevel Recording (Special Issue : Optical Memories)
- Analysis of Signal-to-Noise Ratio Improvement by Multi-tone Demodulation
- Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy