Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
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概要
- 論文の詳細を見る
We present for the first time a nanometer-sized phase-change recording using a scanning near-field optical microscope (PC-SNOM recording). The recording experiments were performed with a SNOM using a 785-nm-wavelength semiconductor Baser diode, shear force detection for gap control and reflected light detection for observing the domains (reading). The recording media of ZnS・SiO_2(20 nm)/GeSbTe(30 nm)/ZnS・SiO_2(150nm)/polycarbonate substrate were used. The writings were done at laser powers of 8.4-7.3 mW in the probe for pulse widths of 5 or 0.5 ms. As a result, we obtained a minimum recorded domain size of 60 nm in diameter. This size shows a potential to achieve an ultrahigh density PC-SNOM recording with about 170 Gb/in^2. A possibility of achieving high speed readout for the future data storage is also discussed.
- 社団法人応用物理学会の論文
- 1996-01-30
著者
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Hosaka S
Hitachi Ltd. Tokyo Jpn
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Hosaka Sumio
Advanced Research Laboratory Hitachi Ltd.
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SHINTANI Toshimichi
Central Research Laboratory, Hitachi, Ltd.
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HIROTSUNE Akemi
Central Research Laboratory, Hitachi, Ltd.
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TERAO Motoyasu
Central Research Laboratory, Hitachi, Ltd.
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Hosaka S
Gunma Univ. Kiryu Jpn
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Terao Motoyasu
Central Resarch Laboratory Hitachi Ltd.
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MIYAMOTO Mitsuhide
Advanced Research Laboratory, Hitachi Ltd.
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SHINTANI Toshimichi
Advanced Research Laboratory, Hitachi Ltd.
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YOSHIDA Masaru
Hitachi Instruments Service Co., Ltd.
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FUJITA Kouichi
Nissei-Sangyo Co., Ltd.
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KAMMER Stefan
TopoMetrix Inc., Santa Clara
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Shintani T
Hitachi Ltd. Tokyo Jpn
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Kammer Stefan
Topometrix Inc. Santa Clara
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Fujita Kouichi
Nissei-sangyo Co. Ltd.
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MIYAMOTO Masanao
Department of Electronic Engineering, University of Tokyo
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Miyamoto M
Department Of Electronic Engineering University Of Tokyo
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Yoshida Masaru
Hitachi Instruments Service Co. Ltd.
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Hirotsune Akemi
Central Research Laboratory Hitachi Ltd.
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HIROTSUNE Akemi
Central Research Laboratory, Hitachi Ltd.
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