Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope

スポンサーリンク

概要

• 論文の詳細を見る

• The feasibility of field-evaporating metal atoms onto an insulator/conducting substrate has been investigated.Theoretical and experimental studies clarify that field evaporation is possible in an atomic force microscope (AFM) metal probe/vacuum/thin insulator/conductor configuration. Theoretically, field evaporation is easily achieved on thin SiO_2 insulators of less than 100 Å, though image potential and electric field weaken in the presence of an insulating layer. Experiments confirm that ultrasmall gold dots can be formed on a natural SiO_2/Si substrate with a threshold voltage of around 10 V. Small dots of 15 nm diameter can be obtained.

• 社団法人応用物理学会の論文
• 1994-09-15

著者

• Hosaka Sumio

  Advanced Research Laboratory Hitachi Ltd.

• KOYANAGI Hajime

  Advanced Research Laboratory, Hitachi Ltd.

• Koyanagi Hajime

  Advanced Research Laboratory Hitachi Ltd.

関連論文

• In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
• Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
• A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
• Atomic Force Microscopy for High Aspect Ratio Structure Metrology
• Phase Controlled Scanning Force Microscope
• High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
• Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
• Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
• Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
• A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
• Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
• Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
• Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

もっと見る 閉じる

スポンサーリンク