Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-03-15
著者
-
Hosaka S
Hitachi Ltd. Tokyo Jpn
-
Hosaka Sumio
Advanced Research Laboratory Hitachi Ltd.
-
Hosaka Sumio
Central Research Laboratory Hitachi Ltd.
-
Hosaka S
Gunma Univ. Kiryu Jpn
-
KIKUKAWA Atsushi
Central Research Laboratory, Hitachi Ltd.
-
KOYANAGI Hajime
Central Research Laboratory, Hitachi Ltd.
-
Kikukawa A
Hitachi Ltd. Tokyo Jpn
-
Kikukawa Atsushi
Central Research Laboratory Hitachi Ltd.
-
Koyanagi H
Hitachi Ltd. Tokyo Jpn
-
Koyanagi Hajime
Central Research Lab. Hitachi Ltd.
-
Hosaka Sumio
Central Research Laboratory Hitachi Lid.
関連論文
- Tunneling Acoustic Microscope
- In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
- Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
- A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
- Highly Precise Atomic Force Microscope Measurement of High-Aspect Nanostructure Free of Probe Bending Error
- Atomic Force Microscopy for High Aspect Ratio Structure Metrology
- XY-Stage-Based Electron-Beam Recorder for the Single-Carrier Independent Pit-Edge Recording Radial Partial Response Format
- XY-Stage Driving Electron-Beam Mastering with Nanometer-Accuracy Positioning for High-Density Optical Disk
- Phase Controlled Scanning Force Microscope
- High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
- Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
- Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
- Effects of Carbon Intermediate Layer on Structural and Magnetic Properties of Double-Layered Perpendicular Magnetic Recording Media(Special Issue on Recent Progress in Information Storage Technology)
- Effect of Nonmagnetic Underlayer on Structural and Magnetic Properties of CoCr-Alloy Thin Film Media(Special Issue on Selected Papers from the 5th Asian Symposium on Information Storage Technology)
- Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
- Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
- In Situ Observation of Gold Adsorption onto Si(111)7×7 Surface by Scanning Tunneling Microscopy
- A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
- Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
- Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
- Monte Carlo Simulation of Energetic Ion Behavior in Amorphous Targets
- Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
- Far-Field and Near-Field Optical Readings of under-50nm-Sized Pits : Optics and Quantum Electronics
- New Edge-Shift Detection Method for Write Strategy Optimization in High-Density Optical Disc Recording
- Pulsed-to-Continuous Read Signal Converter for Increasing Read Signal-to-Noise Ratio
- Aspheric Lens Baser Diode Collimator Design for Optical Intersatellite Communications
- Consideration on Mobility Lowering Phenomenon in PolySi Films Using Tunneling Barrier Height Images
- Read Data Transfer Rate Estimation in Optical Phase Multilevel Recording (Special Issue : Optical Memories)
- Analysis of Signal-to-Noise Ratio Improvement by Multi-tone Demodulation
- Highly Precise Atomic Force Microscope Measurement of High-Aspect Nanostructure Free of Probe Bending Error
- Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy