Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 1998-04-01

著者

• Hosaka Sumio

  Advanced Research Laboratory Hitachi Ltd.

• Nakamura Kimio

  Advanced Research Laboratory Hitachi Ltd.

• Hosaka S

  Gunma Univ. Gunma Jpn

• KOYANAGI Hajime

  Advanced Research Laboratory, Hitachi Ltd.

関連論文

• In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
• Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
• A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
• Atomic Force Microscopy for High Aspect Ratio Structure Metrology
• Phase Controlled Scanning Force Microscope
• High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
• Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
• Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
• Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
• A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
• Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
• Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
• Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
• Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

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