Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

概要

論文の詳細を見る
In this paper we describe a narrow pitch tracking method for data storage using an atomic force microscope (AFM) probe head. A track position of the AFM head on a recording disk was controlled by an optical tracking method. Narrowing of the track pitch was achieved by locating eight recording tracks in one groove of the disk. These track positions were controlled by eight phase tracking-error signals which were created from one groove of the disk. In writing, we used the force modulation recording method which forms written pits by applying force pulses between the AFM tip and the polycarbonate recording disk. Using the recording system, we achieved 200 nm pitch tracking control and readout from written pits as small as 40 nm in diameter. A scanning electron micrograph of the written pits showed that the tracking accuracy was about 20 nm.
Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
1998-04-30