Hosaka Sumio | Advanced Research Laboratory Hitachi Ltd.

スポンサーリンク

概要

関連著者

もっと見る

著作論文

In-line Optical Lever System for Ultrasmall Cantilever Displacement Detection
Nanometer Recording on Graphite and Si Substrate Using an Atomic Force Microscope in Air
A Magnetic Force Microscope Using an Optical Lever Sensor and Its Application to Longitudinal Recording Media
Atomic Force Microscopy for High Aspect Ratio Structure Metrology
Phase Controlled Scanning Force Microscope
High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope
Study of Magnetic Stray Field Measurement on Surface Using New Force Microscope
Simultaneous Observation of 3-Dimensional Magnetic Stray Field and Surface Structure Using New Force Microscope
Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology
Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy
A Cavity-SNOM (Scanning Near-field Optical Microscopy) Head Using a Laser Diode
Thermal Simulation Analysis of Scanning Near-Field Optical Microscope Point Heating Mechanisms
Nanometer-Sized Phase-Change Recording Using a Scanning Near-Field Optical Microscope with a Laser Diode
Field Evaporation of Metal Atoms onto Insulator/Conducting Substrate Using Atomic Force Microscope
Narrow Pitch Tracking Using Optical Head for Recording with Atomic Force Microscopy

もっと見る

スポンサーリンク