Hosaka Sumio | Department Of Production Science Technology Graduate School Of Engineering Gunma University
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概要
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- 同名の論文著者
- Department Of Production Science Technology Graduate School Of Engineering Gunma Universityの論文著者
関連著者
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Hosaka Sumio
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Sone Hayato
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Yin You
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Hosaka Sumio
Department Of Electronic Engineering Gunma University
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Sone Hayato
Department Of Applied Physics The Science University Of Tokyo
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MIYACHI Akihira
Advanced Technology Research Center (ATEC), Gunma University
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NIIDA Daisuke
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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MIYACHI Akihira
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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Niida Daisuke
Department Of Nano-material Systems Graduate School Of Engineering Gunma University
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HOSAKA Sumio
Graduate school of Engineering, Gunma University
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SANO Hirotaka
Graduate school of Engineering, Gunma University
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SONE Hayato
Graduate school of Engineering, Gunma University
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Miyachi Akihira
Advanced Technology Research Center (atec) Gunma University
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Sone Hayato
Graduate School Of Engineering Gunma University
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Morimoto Takafumi
Hitachi Kenki Fine Tech Co. Ltd.
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Hosaka Sumio
Department Of Nano-material Systems Graduate School Of Engineering Gunma University
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YIN You
Satellite Venture Business Laboratory (SVBL), Gunma University
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KOYANAGI Hajime
Central Research Laboratory, Hitachi Ltd.
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KEMBO Yukio
Hitachi Kenki Fine Tech, Co. Ltd.
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Kembo Yukio
Hitachi Kenki Fine Tech Co. Ltd.
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Murayama Ken
Mirai-association Of Super-advanced Electronics Technologies (aset)
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Gonda Satoshi
Mirai-national Institute Of Advanced Industrial Science And Technology (aist)
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Morimoto Takashi
Hitachi Kenki Fine Tech Co. Ltd.
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KOYANAGI Hajime
MIRAI, Association of Super-Advanced Electronics Technologies
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TERASAWA Tsuneo
MIRAI, Association of Super-Advanced Electronics Technologies
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YIN You
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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Mohamad Zulfakri
Department Of Nano Material Systems Graduate School Of Engineering Gunma University
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Sone H
Department Of Nano Material System Graduate School Of Engineering Gunma University
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Sone Hayato
Department Of Nano-material Systems Gunma University
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Hosaka Sumio
Advanced Research Laboratory Hitachi Ltd.
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Hosaka Sumio
Department Of Electronic Engineering Gunma University:central Research Laboratory Hitachi Ltd.
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SHINTANI Toshimichi
Central Research Laboratory, Hitachi, Ltd.
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SHIRA Masumi
Department of Nano Material Systems, Graduate School of Engineering, Gunma University
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SANO Hirotaka
Department of Nano Material Systems, Graduate School of Engineering, Gunma University
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HIGANO Naoya
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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Nishida Tetsuya
Central Research Laboratory Hitachi Ltd.
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Nishida Tetsuya
Central Resarch Laboratory Hitachi Ltd.
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Hosaka Sumio
Department Of Nano Material System Graduate School Of Engineering Gunma University
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SAIKI Toshiharu
Kanagawa Academy of Science and Technology
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TERAUCHI Daisuke
Department of Nano Material System, Graduate School of Engineering, Gunma University
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KURODA Hiroshi
Hitachi Kenki Fine Tech, Co., Ltd.
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MINOMOTO Yasushi
Hitachi Kenki Fine Tech, Co., Ltd.
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NAGANO Yoshiyuki
Hitachi Kenki Fine Tech, Co., Ltd.
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Minomoto Yasushi
Hitachi Kenki Fine Tech Co. Ltd.
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Nagano Yoshiyuki
Hitachi Kenki Fine Tech Co. Ltd.
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Ono Masayuki
Department Of Electronic Engineering Shizuoka Institute Of Science And Technology
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Ono Masayuki
Department Of Nano-material Systems Gunma University
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Shira Masumi
Department Of Nano Material Systems Graduate School Of Engineering Gunma University
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Higano Naoya
Department Of Nano-material Systems Graduate School Of Engineering Gunma University
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Koyanagi Hajime
Central Research Laboratory Hitachi Ltd.
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Koyanagi Hajime
Central Research Lab. Hitachi Ltd.
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FUJINUMA Yoshinori
Department of Nano-Material Systems, Gunma University
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OKANO Haruki
Tokyo Sokki Kenkyujo Co., Ltd.
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Shintani Toshimichi
Central Research Laboratory Hitachi Ltd.
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KATOH Keizo
Central Research Laboratory, Hitachi, Ltd.
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HASAGAWA Tsuyoshi
RIKEN
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Katoh Keizo
Central Research Laboratory Hitachi Ltd.
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Saiki Toshiharu
Kanagawa Academy Of Science Technology
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Kuroda Hiroshi
Hitachi Kenki Fine Tech Co. Ltd.
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Morimoto Takafmi
Hitachi Kenki Fine Tech, Co., Ltd.
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Yin You
Department of Nano-Material Systems, Graduate School of Engineering, Gunma University, 1-5-1 Tenjin, Kiryu, Gunma 376-8515, Japan
著作論文
- Extremely Small Proximity Effect in 30keV Electron Beam Drawing with Thin Calixarene Resist for 20 x 20nm^2 Pitch Dot Arrays
- Ultra Low Operation Current Lateral Phase-Change Memory
- A Novel Lateral Phase-Change Random Access Memory Characterized by Ultra Low RESET Current and Power Consumption
- Memory Effect in Metal-Chalcogenide-Metal Structures for Ultrahigh-Density Nonvolatile Memories
- Finite Element Analysis of Dependence of Programming Characteristics of Phase-Change Memory on Material Properties of Chalcogenides
- Simulation of Proposed Confined-Chalcogenide Phase-Change Random Access Memory for Low Reset Current by Finite Element Modelling
- Annealing effect of phase change and current control in phase change channel transistor memory
- Dependences of Electrical Properties of Thin GeSbTe and AgInSbTe Films on Annealing
- Highly Precise Atomic Force Microscope Measurement of High-Aspect Nanostructure Free of Probe Bending Error
- Atomic Force Microscopy for High Aspect Ratio Structure Metrology
- Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface
- Prototype of Atomic Force Cantilevered SNOM Based on Though-The-Lens-Type Optical Lever and Polarized Illumination and Detection System
- Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope
- Side-Wall Measurement using Tilt-Scanning Method in Atomic Force Microscope
- Terabits Patterning : Electron beam drawing with a bit pitch and track pitch of 25nm
- Terabits Patterning : Electron beam drawing with a bit pitch and track pitch of 25nm
- Terabits Patterning : Electron beam drawing with a bit pitch and track pitch of 25nm(Patterned media & MRAM,The 8th Asian Symposium on Information Storage Technology (ASIST-8))
- Picogram Mass Sensor Using Resonance Frequency Shift of Cantilever
- Picogram Mass Sensor Using Piezoresistive Cantilever for Biosensor
- Far-Field and Near-Field Optical Readings of under-50nm-Sized Pits : Optics and Quantum Electronics