MIYACHI Akihira | Advanced Technology Research Center (ATEC), Gunma University
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概要
関連著者
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Sone Hayato
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Sone Hayato
Department Of Applied Physics The Science University Of Tokyo
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Hosaka Sumio
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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MIYACHI Akihira
Advanced Technology Research Center (ATEC), Gunma University
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Miyachi Akihira
Advanced Technology Research Center (atec) Gunma University
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Hosaka Sumio
Department Of Electronic Engineering Gunma University
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Yin You
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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MIYACHI Akihira
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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YIN You
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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Mohamad Zulfakri
Department Of Nano Material Systems Graduate School Of Engineering Gunma University
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SHIRA Masumi
Department of Nano Material Systems, Graduate School of Engineering, Gunma University
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SANO Hirotaka
Department of Nano Material Systems, Graduate School of Engineering, Gunma University
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NIIDA Daisuke
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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HIGANO Naoya
Department of Nano-material Systems, Graduate School of Engineering, Gunma University
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Shira Masumi
Department Of Nano Material Systems Graduate School Of Engineering Gunma University
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Higano Naoya
Department Of Nano-material Systems Graduate School Of Engineering Gunma University
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Niida Daisuke
Department Of Nano-material Systems Graduate School Of Engineering Gunma University
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Yin You
Department of Nano-Material Systems, Graduate School of Engineering, Gunma University, 1-5-1 Tenjin, Kiryu, Gunma 376-8515, Japan
著作論文
- Extremely Small Proximity Effect in 30keV Electron Beam Drawing with Thin Calixarene Resist for 20 x 20nm^2 Pitch Dot Arrays
- Ultra Low Operation Current Lateral Phase-Change Memory
- Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface