Simulation of Proposed Confined-Chalcogenide Phase-Change Random Access Memory for Low Reset Current by Finite Element Modelling
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Sone Hayato
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Hosaka Sumio
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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Yin You
Department Of Production Science Technology Graduate School Of Engineering Gunma University
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