Fine Structure of Crack in Yttrium Oxide and Aluminum Oxide Fluxed Silicon Nitride

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文

著者

• KAKIBAYASHI Hiroshi

  The authors are with Central Research Laboratory, Hitachi Ltd.

• Nagata F

  Hitachi Instruments Engineering Co. Ltd. Tokyo Jpn

• Kakibayashi H

  Hitachi Ltd. Tokyo Jpn

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• Fine Structure of Crack in Yttrium Oxide and Aluminum Oxide Fluxed Silicon Nitride
• Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current

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