Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs / AlGaAs Superstructure

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Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope
Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs / AlGaAs Superstructure
Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
Microstructure of CoCr Thin Films Prepared by Sputtering
Investigation of the Si Oxidation Process by XANES Spectroscopy Using Synchrotron Radiation
Microstructure of Visible Light Emitting Porous Silicon
Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type
Electron Emission Properties and Surface Atom Behavior of an Impregnated Cathode Coated with Tungsten Thin Film Containing Sc_2O_3
Some Fundamental Properties of Ir Coated Impregnated Cathodes
Current Status and Future Trend of Analytical Instruments for Failure Analyses in Si Process
Highly Accurate Composition Analysis of (Pb, Zr)TiO_3 Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer
Comparison of Relaxation Process of Compressive and Tensile Strains in InGaAs Lattice-Mismatched Layers on InP Substrates
Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images
High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM
Direct Observation of Strain Distribution in InP/In_Ga_xP Heterointerfaces by the Compositional Analysis by Thickness Fringe Method
Observation of Fine Compositional Fluctuation in GaAs/AI_xGa_As Superstructure Using Composition Analysis by Thickness-Fringe (CAT) Method
Three-dimensional STEM for observing nanostructures
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Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current
Influence of Substrate Misorientation on Surface Morphology of Be-Doped GaAs Grown by MBE
Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_ As Multilayer Structure
Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/ Al_xGa_As Superstructure
Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
New Structure on TiN(001) Cleaved Surfaces
Depth Profiling of Superstructures by μ-AES Utilizing Angle-Lapped Specimens: Techniques, Instrumentations and Measurement
Detection of Strain in InP/InGaP Superlattices by Dark-Field Electron Microscopy and Nano-Diffraction Technique
Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy
Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
Substrate Misorientation Effect on Be Transport during MBE Growth of GaAs

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