High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-06-01
著者
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KAKIBAYASHI Hiroshi
Central Research Laboratory, Hitachi Ltd.
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TSUCHIYA Tomonobu
Central Research Laboratory, Hitachi, Ltd.
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Tsuchiya Tomonobu
Central Research Laboratory Hitachi Ltd
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MURAKOSHI Hisaya
Central Research Laboratory, Hitachi, Ltd
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Murakoshi Hisaya
Central Research Laboratory Hitachi Ltd
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Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd
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