Kakibayashi Hiroshi | Central Research Laboratory Hitachi Ltd
スポンサーリンク
概要
関連著者
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Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd
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KAKIBAYASHI Hiroshi
Central Research Laboratory, Hitachi Ltd.
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Nagata Fumio
Central Research Laboratory Hitachi Ltd
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Kakibayashi H
Hitachi Ltd. Tokyo Jpn
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KAKIBAYASHI Hiroshi
The authors are with Central Research Laboratory, Hitachi Ltd.
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Tsuneta Ruriko
Central Research Laboratory Hitachi Ltd
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Tsuneta R
Hitachi Ltd Tokyo Jpn
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NAKAMURA Kuniyasu
Central Research Laboratory, Hitachi Ltd.
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Nakamura Kuniyasu
Central Research Laboratory Hitachi Ltd
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KOGUCHI Masanari
Central Research Laboratory, Hitachi Ltd.
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TSUCHIYA Tomonobu
Central Research Laboratory, Hitachi, Ltd.
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Nakamura K
Department Of Electrical Engineering School Of Engineering Nagoya University
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Tsuchiya Tomonobu
Central Research Laboratory Hitachi Ltd
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Shimotsu Teruho
Central Research Laboratory Hitachi Ltd.
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Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd.
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Koguchi Masanari
Central Research Laboratory Hitachi Ltd
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Honda Y
Department Of Electronics Nagoya University
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Honda Yoshio
Department Of Electronics School Of Engineering Nagoya University Chikusa-ku Nagoya
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HONDA Yukio
Central Research Laboratory, Hitachi Ltd.
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FUTAMOTO Masaaki
Central Research Laboratory, Hitachi Ltd.
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Honda Yoshio
Department Of Electronics Nagoya University
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Honda Y
Tsukuba Research Laboratory Sumitomo Chemical Co. Ltd.
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GOTO Shigeo
Central Research Laboratory, Hitachi Ltd.
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MITSUI Yasuhiro
Semiconductor & Integrated Circuits Division, Hitachi Ltd.
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MATSUNAGA Fumiko
Central Research Laboratory, Hitachi, Ltd.
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SHIMOTSU Teruho
Central Research Laboratory, Hitachi Ltd.
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Honda Yukio
Central Research Laboratory Hitachi Ltd.
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MOCHIZUKI Kazuhiro
Central Research Laboratory, Hitachi Ltd.
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Kusano Chuushiro
Central Research Laboratory, Hitachi Ltd.
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Mochizuki Kazuhiro
Central Research Lab.hitachi Ltd.
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Futamoto M
Hitachi Ltd. Kokubunji‐shi Jpn
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Futamoto Masaaki
Central Research Laboratory Hitachi Ltd.
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Tanaka Nobuo
Department Of Agro-environmental Sciences Graduate School Of Bioresource And Bioenvironmental Scienc
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Matsunaga Fumiko
Central Research Laboratory Hitachi Ltd
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KAKIBAYASHI Hiroshi
Central Research Laboratory, Hitachi, Ltd
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吉田 起國
京大院エネルギー科学
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吉田 起國
京大原子エネルギー研
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吉田 起國
京大原研
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Nakatani Ryoichi
Central Research Laboratory Hitachi Ltd.
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Shimada Toshikazu
Electronics Research Laboratory Nissan Motor Co. Ltd.
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Mishima Tomonori
Central Research Laboratory Hitachi Ltd.
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NAKAGAWA Kiyokazu
Center for Crystal Science and Technology, University of Yamanashi
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Iwaki Masaya
The Institute Of Physical And Chemical Research
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KOMORI Masaaki
Central Research Lab. HITACHI, Ltd.
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KASE Kiwamu
The Institute of Physical and Chemical Research
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Yamada K
Department Of Physics Tohoku University
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Nishida Akio
Central Research Laboratory Hitachi Ltd.
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SHIMADA Toshikazu
Central Research Laboratory, Hitachi Ltd.
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NAKAGAWA Kiyokazu
Central Research Laboratory, Hitachi Ltd.
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AOYAMA Takashi
Hitachi Research Laboratory, Hitachi Ltd.
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KAWASE Susumu
Central Research Laboratory, Hitachi, Ltd.
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TORII Kazuyoshi
Central Research Laboratory, Hitachi, Ltd.
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Hosomi Kazuhiko
Nanoelectronics Collaborative Research Center Institute Of Industrial Science University Of Tokyo
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Kanehori Keiichi
Central Research Laboratory Hitachi Ltd
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Nakagawa Kenichi
Liquid Ctystal Laboratories Sharp Corporation
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Tsuchiya Tomonobu
Central Research Laboratory Hitachi Ltd.
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TANIWATARI Tsuyoshi
Central Research Laboratory, Hitachi Ltd.
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KARIYA Michihiko
Department of Electrical and Electronic Engineering, Meijo University
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YOSHIDA Kazuetsu
Central Research Laboratory, Hitachi Ltd.,
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UESAKA Yasutarou
Central Research Laboratory, Hitachi Ltd.
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Torii Kazuyoshi
Central Research Laboratory Hitachi Lid.
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Goto S
Central Research Laboratory Hitachi Ltd.
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Hiruma Kenji
Central Research Laboratory, Hitachi, Ltd.
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Suga Mitsuo
Central Research Laboratory Hitachi Ltd.
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Yano F
Semiconductor & Integrated Circuits Division Hitachi Limited
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Yano Fumiko
Central Research Laboratory Hitachi Ltd.
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Hiruma Kenji
Central Research Laboratory Hitachi Ltd.
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Katsuragawa Maki
Meijo University
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Kawase S
Osaka Univ. Osaka Jpn
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Kawase Susumu
Central Research Laboratory Hitachi Ltd.:(present Address) Hitachi Research Institute
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Itoh Kazuhiro
Optoelectronics Technique Research Corporation
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Nishida A
Hitachi Ltd. Tokyo Jpn
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Aoyama T
Hitachi Research Laboratory Hitachi Limited
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Komori M
Meijo Univ. Nagoya Jpn
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Komori Masaaki
Central Research Lab. Hitachi Ltd.
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Haraguchi Kei-ichi
Central Research Laboratory Hitachi Ltd.
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Katsuyama Toshio
Central Research Laboratory Hitachi Ltd.
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YAZAWA Masamitsu
Central Research Laboratory, Hitachi Ltd.
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Yazawa Masamitsu
Central Research Laboratory Hitachi Ltd.
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KATAYAMA Yoshifumi
Central Research Laboratory, Hitachi Ltd.
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Mihama Kazuhiro
Department Of Applied Physics Faculty Of Engineering Nagoya University
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Mihama Kazuhiro
Department Of Applied Physics School Of Engineering Nagoya University
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Shimada T
Presto Japan Science And Technology Corporation (jst) And Department Of Chemistry The University Of
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Nakagawa K
Center For Crystal Science And Technology University Of Yamanashi
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Shiraki Yasuhiro
Central Research Laboratory Hitachi Ltd.
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Ono Y
Central Research Laboratory Hitachi Ltd
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YANO Fumiko
Semiconductor & Integrated Circuits Division, Hitachi Limited
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KUMIHASHI Takashi
Central Research laboratory, Hitachi Ltd.
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Hiruma K
Central Research Laboratory Hitachi Ltd.
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Uesaka Yasutarou
Central Research Laboratory Hitachi Ltd.
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Shimada Toshikazu
Central Research Laboratory
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Mochizuki K
Central Research Laboratory Hitachi Ltd.
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Nagata F
Hitachi Instruments Engineering Co. Ltd. Tokyo Jpn
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ONO Yuichi
Central Research Laboratory, Hitachi, Ltd.
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TSUNETA Ruriko
Central Research Laboratory, Hitachi Ltd.
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Tsuneta Rukiko
Central Research Laboratory, Hitachi, Ltd.
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MURAKOSHI Hisaya
Central Research Laboratory, Hitachi, Ltd
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Tsuneta Rukiko
Central Research Laboratory Hitachi Ltd.
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Nakagawa Kiyokazu
Central Research Laboratory Hitachi Ltd.
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Mitsui Y
Semiconductor & Integrated Circuits Division Hitachi Limited
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Mitsui Yasuhiro
Semiconductor & Integrated Circuits Division Hitachi Ltd.
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Kusano C
Central Research Laboratory Hitachi Ltd.
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Murakoshi Hisaya
Central Research Laboratory Hitachi Ltd
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Nakagawa Keisuke
Department Of Applied Physics Faculty Of Science Science University Of Tokyo
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Yamaoka Masahiro
Central Research Laboratory Hitachi Ltd
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Minagawa Shigekazu
Central Research Laboratory Hitachi Lid.
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Taniwatari Tsuyoshi
Central Research Laboratory Hitachi Ltd.
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Kumihashi Takashi
Central Research Laboratory Hitachi Ltd.
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Niino Toshiki
Tokyo University
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TANAKA Nobuo
Nagoya University
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Katayama Yoshifumi
Central Research Laboratory
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Koguchi Masanari
Central Research Laboratory Hitachi Ltd.
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Matsunaga F
Central Research Laboratory Hitachi Ltd.
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Tanaka Nobuo
Department Of Applied Physics School Of Engineering Nagoya University
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Aoyama Takashi
Hitachi Research Laboratory Hitachi Ltd
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Ono Yuichi
Central Research Laboratory Hitachi Ltd.
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Shiraki Yasuhiro
Central Research Laboratory
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Tanaka Nobuo
Nagoya Univ. Furo‐cho Nagoya Jpn
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Kakibayashi Hiroshi
Central Research Laboratory, Hitachi, Ltd.
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KATAYAMA Yoshifumi
Central Research Laboratory, Hitachi, Ltd.
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Tsuneta Ruriko
Central Research Laboratory, Hitachi Ltd
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Nagata Fumio
Central Research Laboratory, Hitachi, Ltd.
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Torii Kazuyoshi
Central Research laboratory, Hitachi Ltd.
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Koguchi Masanari
Central Research Laboratory, Hitachi Ltd
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Kakibayashi Hiroshi
Central Research Laboratory, Hitachi Ltd
著作論文
- Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope
- Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs / AlGaAs Superstructure
- Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
- Microstructure of CoCr Thin Films Prepared by Sputtering
- Microstructure of Visible Light Emitting Porous Silicon
- Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type
- Current Status and Future Trend of Analytical Instruments for Failure Analyses in Si Process
- Highly Accurate Composition Analysis of (Pb, Zr)TiO_3 Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer
- Comparison of Relaxation Process of Compressive and Tensile Strains in InGaAs Lattice-Mismatched Layers on InP Substrates
- Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images
- High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM
- Direct Observation of Strain Distribution in InP/In_Ga_xP Heterointerfaces by the Compositional Analysis by Thickness Fringe Method
- Observation of Fine Compositional Fluctuation in GaAs/AI_xGa_As Superstructure Using Composition Analysis by Thickness-Fringe (CAT) Method
- Three-dimensional STEM for observing nanostructures
- Position Alignment in Algebraic Reconstruction Method by Using Center of Gravity
- Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
- Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
- Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current
- Influence of Substrate Misorientation on Surface Morphology of Be-Doped GaAs Grown by MBE
- Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_ As Multilayer Structure
- Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/ Al_xGa_As Superstructure
- Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
- New Structure on TiN(001) Cleaved Surfaces
- Depth Profiling of Superstructures by μ-AES Utilizing Angle-Lapped Specimens: Techniques, Instrumentations and Measurement
- Detection of Strain in InP/InGaP Superlattices by Dark-Field Electron Microscopy and Nano-Diffraction Technique
- Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy
- Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
- Substrate Misorientation Effect on Be Transport during MBE Growth of GaAs