Nakamura Kuniyasu | Central Research Laboratory Hitachi Ltd
スポンサーリンク
概要
関連著者
-
Nakamura Kuniyasu
Central Research Laboratory Hitachi Ltd
-
NAKAMURA Kuniyasu
Central Research Laboratory, Hitachi Ltd.
-
Tsuneta Ruriko
Central Research Laboratory Hitachi Ltd
-
Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd
-
Nakamura K
Department Of Electrical Engineering School Of Engineering Nagoya University
-
Tsuneta R
Hitachi Ltd Tokyo Jpn
-
Kakibayashi H
Hitachi Ltd. Tokyo Jpn
-
Koguchi Masanari
Central Research Laboratory Hitachi Ltd
-
KOGUCHI Masanari
Central Research Laboratory, Hitachi Ltd.
-
UMEMURA Kaoru
Naka Division, Hitachi High-Technologies Corporation
-
KAKIBAYASHI Hiroshi
The authors are with Central Research Laboratory, Hitachi Ltd.
-
Umemura Kaoru
Naka Division Hitachi High-technologies Corporation
-
Nakamura Kuniyasu
Central Research Laboratory Hitachi Ltd.
-
Koguchi M
Hitachi Ltd Tokyo Jpn
-
MITSUI Yasuhiro
Semiconductor & Integrated Circuits Division, Hitachi Ltd.
-
Kanehori Keiichi
Central Research Laboratory Hitachi Ltd
-
Fukuda Muneyuki
Central Research Laboratory Hitachi Ltd.
-
TOMIMATSU Satoshi
Central Research Lab., Hitachi, Ltd.
-
Mitsui Yasuhiro
Semiconductor & Integrated Circuits Division Hitachi Ltd.
-
Nishida Akio
Semiconductor * Integrated Circuits Division Hitachi Ltd
-
SHICHI Hiroyasu
Central Research Laboratory, Hitachi Ltd.
-
Shichi Hiroyasu
Central Research Laboratory Hitachi Ltd.
-
Tomimatsu Satoshi
Central Research Laboratory Hitachi Ltd.
-
Tanaka Nobuo
Department Of Agro-environmental Sciences Graduate School Of Bioresource And Bioenvironmental Scienc
-
UMEMURA Kaoru
Central Research Laboratory, Hitachi Ltd.
-
Kakibayashi Hiroshi
Central Research Laboratory, Hitachi Ltd
著作論文
- A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
- A specimen-drift-free EDX mapping system in a STEM for observing two-dimensional profiles of low dose elements in fine semiconductor devices
- Position Alignment in Algebraic Reconstruction Method by Using Center of Gravity
- Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
- Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
- Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
- High-Resolution Stress Mapping of 100-nm Devices Measured by Stress TEM