A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

スポンサーリンク

概要

論文の詳細を見る
2004-10-01

著者

関連論文

Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope
Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type
Cu Film Growth on a Si(111) Surface Studied by Scanning Tunneling Microscopy
Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
Hetero-Epitaxial PbZr_Ti_O_3 Capacitors with Oxide Electrodes(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)
A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
Three-Dimensional Structure Analysis of Metal-Oxide-Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy
Three-dimensional STEM for observing nanostructures
A specimen-drift-free EDX mapping system in a STEM for observing two-dimensional profiles of low dose elements in fine semiconductor devices
Position Alignment in Algebraic Reconstruction Method by Using Center of Gravity
Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
High Contrast of Scanning Ion Microscopy Images Shows Element Segregation
Microstructures of Co/Cr Bilayer Films Epitaxially Grown on MgO Single-Crystal Substrates
Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
High-Resolution Stress Mapping of 100-nm Devices Measured by Stress TEM

もっと見る

スポンサーリンク