Three-dimensional STEM for observing nanostructures

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Observation of Fe-Mn Oxidation Process Using Specimen Transfer Chamber and Ultrahigh-Vacuum Transmission Electron Microscope
Three-Axis NC Cutter Path Generation for Subdivision Surface with Z-Map
Model-Based Simulation System for Planning Numerical Controlled Multi-Axis 3D Surface Scanning Machine
Concentration Profiles of Nickel and Chromium Implanted in Mild Steel
Eleetroluminescence of Europium Ion-Implanted Aluminum during Anodization
Frictional Properties of Nickel and Copper Implanted Low Carbon Steel Plates
XY-Stage-Based Electron-Beam Recorder for the Single-Carrier Independent Pit-Edge Recording Radial Partial Response Format
Influence of Ion Sputtering on Auger Electron Spectroscopy Depth-Profiling of GaAs / AlGaAs Superstructure
XY-Stage Driving Electron-Beam Mastering with Nanometer-Accuracy Positioning for High-Density Optical Disk
Comparison of Microstructure of Cross-Sectional CoCr Thin Film Specimens Prepared by Fracture, Microtome, and Ion-Beam Thinning Methods
Microstructure of CoCr Thin Films Prepared by Sputtering
Microstructure of Visible Light Emitting Porous Silicon
Lattice Location of Ni Atoms Implanted into Al Crystals as Investigated by Means of Channeling Method
Crystal Structure Change of GaAs and InAs Whiskers from Zinc-Blende to Wurtzite Type
Effect of Ion Implantations and Post-treatments on Optical Transmission of Fluorozirconate Glass
Optical Characterization of Ion-Implanted Glass Surface Layers with Surface Plasmon Resonance Method
Ion-Beam-Induced White Luminescence of CaF_2 Implanted with Both Eu and Tb Ions
Current Status and Future Trend of Analytical Instruments for Failure Analyses in Si Process
Highly Accurate Composition Analysis of (Pb, Zr)TiO_3 Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer
Improvement of Electron Beam Recorder for Mastering of Future Storage Media
Comparison of Relaxation Process of Compressive and Tensile Strains in InGaAs Lattice-Mismatched Layers on InP Substrates
Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images
High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM
First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM
Direct Observation of Strain Distribution in InP/In_Ga_xP Heterointerfaces by the Compositional Analysis by Thickness Fringe Method
A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
Anodic Dissolution Behaviour of Si- and Ti-Implanted Iron
Three-Dimensional Structure Analysis of Metal-Oxide-Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy
Observation of Fine Compositional Fluctuation in GaAs/AI_xGa_As Superstructure Using Composition Analysis by Thickness-Fringe (CAT) Method
Three-dimensional STEM for observing nanostructures
A specimen-drift-free EDX mapping system in a STEM for observing two-dimensional profiles of low dose elements in fine semiconductor devices
Position Alignment in Algebraic Reconstruction Method by Using Center of Gravity
Simulation Study of Noise Influence in 3-Dimensional Reconstruction using High-Angle Hollow-Cone Dark-Field Transmission Electron Microscope Images
Atomic Species Analysis and Three-Dimensional Observation by High-Angle Hollow-Cone Dark-Field Transmission Electron Microscopy
Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current
Influence of Substrate Misorientation on Surface Morphology of Be-Doped GaAs Grown by MBE
Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_ As Multilayer Structure
Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/ Al_xGa_As Superstructure
Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
New Structure on TiN(001) Cleaved Surfaces
Depth Profiling of Superstructures by μ-AES Utilizing Angle-Lapped Specimens: Techniques, Instrumentations and Measurement
Detection of Strain in InP/InGaP Superlattices by Dark-Field Electron Microscopy and Nano-Diffraction Technique
Observation of OMVPE-Grown GaInP/GaAs Cross-Sections by Transmission Electron Microscopy
Microstructures of Co/Cr Bilayer Films Epitaxially Grown on MgO Single-Crystal Substrates
Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation
High-Resolution Stress Mapping of 100-nm Devices Measured by Stress TEM
Preface to EELS special issue
Substrate Misorientation Effect on Be Transport during MBE Growth of GaAs

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