TORII Kazuyoshi | Central Research Laboratory, Hitachi, Ltd.

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概要

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著作論文

Strain-Imaging Observation of Pb(Zr, Ti)O_3 Thin Films
Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
Electro-Luminescence from Ultra-Thin Silicon
Inversion Electron Mobility Affected by Phase Separation in High-Permittivity Gate Dielectrics
Dielectric Properties of RF-Magnetron-Sputtered (Ba, Pb)(Zr, Ti)O_3 Thin Films
Single-Target Sputtering Process for Lead Zirconate Titanate Thin Films with Precise Composition Control
A High-Endurance Read/Write Scheme for Half-V_cc Plate Nonvolatile DRAMs with Ferroelectric Capacitors(Special Issue on Nonvolatile Memories)
A TiO2 Gate Insulator of a 1-nm Equivalent Oxide Thickness Deposited by Electron-Beam Evaporation
Effective Electron Mobility Reduced by Remote Charge Scattering in High-K Gate Stacks : Short Note
Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O_3 Capacitors with a Platinum Electrode
Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
A Novel Laser Annealing Process for Advanced CMOS with Suppressed Gate Depletion and Ultra-shallow Junctions
Highly Accurate Composition Analysis of (Pb, Zr)TiO_3 Using a Scanning Electron Microscope/Energy Dispersive X-Ray Spectrometer

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