Kushida‐abdelghafar K | The Authors Are With Central Research Laboratory Hitachi Ltd.
スポンサーリンク
概要
関連著者
-
Kushida‐abdelghafar K
The Authors Are With Central Research Laboratory Hitachi Ltd.
-
MIKI Hiroshi
Department of Pathology, Kagawa Medical University
-
Miura H
Hitachi Ltd. Tsuchiura‐shi Jpn
-
Miki Hiroshi
Central Research Laboratory Hitachi Limited
-
TORII Kazuyoshi
Central Research Laboratory, Hitachi, Ltd.
-
Torii K
Central Research Laboratory Hitachi Ltd.
-
Torii Kazuyoshi
Central Research Laboratory Hitachi Lid.
-
Torii K
Semiconductor Leading Edge Technol. Inc. Tsukuba-shi Jpn
-
Miki Hiroshi
Central Research Laboratory Hitachi Ltd.
-
Fujisaki Y
R&d Association For Future Electron Devices
-
Fujisaki Yoshihisa
R&D Association for Future Electron Devices
-
FUJISAKI Yoshihisa
Central Research Laboratory, Hitachi Ltd.
-
KUSHIDA Keiko
Central Research Lab., Hitachi, Lid.
-
Fujisaki Yoshihisa
Central Research Laboratory Hitachi Limited
-
Kushida K
Hitachi Ltd. Tokyo Jpn
-
Matsui Yasushi
Electronics Research Laboratory Corporate Research & Development Matsushita Electronics Corporat
-
MATSUI Yuichi
Central Research Laboratory, Hitachi, Ltd.
-
Muto Y
The Institute For Materials Research Tohoku University
-
Kushida-abdelghafar Keiko
Central Research Laboratory Hitachi Limited
-
Takata Keiji
Advanced Research Laboratory, Hitachi Ltd.
-
Takata K
Hitachi Ltd. Saitama Jpn
-
Takata Keiji
Advanced Research Laboratory Hitachi Ltd.
-
Takata Keiji
Advanced Research Laboratory Hitachi Ltd
-
Yano Fumiko
Central Research Laboratory Hitachi Limited
-
Shimamoto Yasuhiro
Central Research Laboratory Hitachi Ltd.
-
FUJISAKI Yoshihisa
The authors are with Central Research Laboratory, Hitachi Ltd.
-
KUSHIDA-ABDELGHAFAR Keiko
The authors are with Central Research Laboratory, Hitachi Ltd.
-
MIKI Hiroshi
The authors are with Central Research Laboratory, Hitachi Ltd.
-
SHIMAMOTO Yasuhiro
The authors are with Central Research Laboratory, Hitachi Ltd.
-
Shimamoto Y
Hitachi Ltd. Tokyo Jpn
著作論文
- Strain-Imaging Observation of Pb(Zr, Ti)O_3 Thin Films
- Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O_3 Capacitors with a Platinum Electrode
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Improved Resistance Against the Reductive Ambient Annealing of Ferroelectric Pb(Zr, Ti)O_3 Thin Film Capacitors with IrO_2 Top Electrode(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)
- IrO_2/Pb(Zr_xTi_)O_3(PZT)/Pt Ferroelectric Thin-Film Capacitors Resistant to Hydrogen-Annealing Damage