FUJISAKI Yoshihisa | Central Research Laboratory, Hitachi Ltd.

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概要

• Fujisaki Yoshihisaの詳細を見る
• 同名の論文著者
• Central Research Laboratory, Hitachi Ltd.の論文著者

関連著者

• FUJISAKI Yoshihisa

  Central Research Laboratory, Hitachi Ltd.

• Fujisaki Yoshihisa

  Central Research Laboratory Hitachi Limited

• Fujisaki Y

  R&d Association For Future Electron Devices

• Fujisaki Yoshihisa

  R&D Association for Future Electron Devices

• Miura H

  Hitachi Ltd. Tsuchiura‐shi Jpn

• Miki Hiroshi

  Central Research Laboratory Hitachi Ltd.

• Miki Hiroshi

  Central Research Laboratory Hitachi Limited

• MIKI Hiroshi

  Department of Pathology, Kagawa Medical University

• Matsui Yasushi

  Electronics Research Laboratory Corporate Research & Development Matsushita Electronics Corporat

• MATSUI Yuichi

  Central Research Laboratory, Hitachi, Ltd.

• Muto Y

  The Institute For Materials Research Tohoku University

• Kushida‐abdelghafar K

  The Authors Are With Central Research Laboratory Hitachi Ltd.

• TORII Kazuyoshi

  Central Research Laboratory, Hitachi, Ltd.

• Torii K

  Central Research Laboratory Hitachi Ltd.

• Torii Kazuyoshi

  Central Research Laboratory Hitachi Lid.

• Torii K

  Semiconductor Leading Edge Technol. Inc. Tsukuba-shi Jpn

• Kushida-abdelghafar Keiko

  Central Research Laboratory Hitachi Limited

• Hiratani M

  Central Research Laboratory Hitachi Ltd.

• Hiratani M

  Central Research Laboratory Hitachi Ltd

• Hiratani Masahiko

  Central Research Laboratory Hitachi Ltd.

• Takano Y

  Department Of Pharmacology Faculty Of Pharmaceutical Sciences Fukuoka University

• Takano Yukio

  Department Of Physiology And Pharmacology Faculty Of Pharmaceutical Sciences Fukuoka University

• Takano Yukio

  Central Research Laboratory Hitachi Ltd.

• Takano Yukio

  Central Research Laboratory

• ISHIBA Tsutomu

  Central Research Laboratory, Hitachi Ltd.

• Matsui Y

  Assoc. Super‐advanced Electronics Technol. (aset) Kanagawa Jpn

• Matsui Y

  Nims Tsukuba Jpn

• SHIMAMOTO Yasuhiro

  Central Research Laboratory, Hitachi, Ltd.

• Matsui Y

  Central Research Laboratory Hitachi Ltd.

• Ishiba T

  Central Research Laboratory Hitachi Ltd.

• Ishiba Tsutomu

  Central Research Laboratory Hitachi Ltd.

• KUSHIDA Keiko

  Central Research Lab., Hitachi, Lid.

• Shimamoto Yasuhiro

  Central Research Laboratory Hitachi Ltd.

• Shimamoto Y

  Hitachi Ltd. Tokyo Jpn

• KUROIWA Takeharu

  Advanced Technology R&D Center, Mitsubishi Electric Corporation

• Sakaguchi Harunori

  Cable Research Laboratory, Hitachi Cable, Ltd.

• Ono Yuuichi

  Central Research Laboratory, Hitachi, Ltd.

• FURUKAWA Taisuke

  Advanced Technology R&D Center, Mitsubishi Electric Corporation

• ISHIWARA Hiroshi

  Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology

• Ishiwara Hiroshi

  Interdisciplinary Graduate School Of Science And Engineering Tokyo Institute Of Technology

• Suga Mitsuo

  Central Research Laboratory Hitachi Ltd.

• Ono Yuuichi

  Central Research Laboratory Hitachi Ltd.

• Ishiwara H

  Tokyo Institute Of Technology Interdisciplinary Graduate School Of Science And Engineering

• Yano Fumiko

  Central Research Laboratory Hitachi Limited

• Kushida K

  Hitachi Ltd. Tokyo Jpn

• SATO Takehiko

  Advanced Technology R&D Center, Mitsubishi Electric Corporation

• CHEN Po-ching

  central Research Laboratory, Hitachi, Ltd.

• Chen Po-ching

  Central Research Laboratory Hitachi Ltd.

• Fujisaki Sumiko

  Hitachi Ltd. Tokyo Jpn

• Fujisaki Sumiko

  Hitachi Ltd.

• Sakaguchi Harunori

  Cable Research Laboratory Hitachi Cable Ltd.

• Fujisaki Sumiko

  Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokoham

• Fujisaki Yoshihisa

  Central Research Laboratory Hitachi Ltd.

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著作論文

• Nondestruetive Characterization of Deep Levels in Semi-Insulating GaAs Wafers Using Microwave Impedance Measurement
• Dependence of Deep Level Concentration on Nonstoiehiometry in MOCVD GaAs
• Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
• Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O_3 Capacitors with a Platinum Electrode
• Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
• Analysis of Decomposed Layer Appearing on the Surface of Barium Strontium Titanate
• Effects of Post-Annealing Temperatures and Ambient Atmospheres on the Electrical Properties of Ultrathin (Ba, Sr) TiO_3 Capacitors
• Fatigueless Ferroelectric Capacitors with Ruthenium Bottom and Top Electrodes Formed by Metalorganic Chemical Vapor Deposition
• IrO_2/Pb(Zr_xTi_)O_3(PZT)/Pt Ferroelectric Thin-Film Capacitors Resistant to Hydrogen-Annealing Damage
• IrO_2/Pb (Zr_xTi_)O_3(PZT)/Pt Ferroelectric Thin-Film Capacitors Resistant to an Interlayer-Dielectric-Deposition Process
• Oxygen Diffusion in Pt Botton Electrodes of Ferroelectric Capacitors
• Organic Ferroelectric Diodes with Long Retention Characteristics Suitable for Non-Volatile Memory Applications

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