A High-Endurance Read/Write Scheme for Half-V_cc Plate Nonvolatile DRAMs with Ferroelectric Capacitors(Special Issue on Nonvolatile Memories)

概要

論文の詳細を見る
A small data-line-swing read/write scheme is described for half-V_cc plate nonvolatile DRAMs with ferroelectric capacitors designed to achieve high reliability for read/write operations. In this scheme, the normal read/write operation holds the data as a charge with a small data-line-swing, and the store operation provides sufficient polarization with a full data-line-swing. This scheme enables high read/write endurance, because the small data-line-swing reduces the fatigue of the ferroelectric capacitor. Two circuit technologies are used in this scheme to increase the operating margin. The first is a plate voltage control technique that solves the polarization retention problem of half-V_cc plate nonvolatile DRAM technologies. The second is a doubled data-line-capacitance recall technique that connects two data lines to a cell and enlarges the readout signal compared to normal operation, when only one data line is connected to a cell. These techniques and circuits improve the write-cycle endurance by almost three orders of magnitude, while reducing the array power consumption during read/write operations to one-third that of conventional nonvolatile DRAMs.
社団法人電子情報通信学会の論文
2001-06-01