Nagata Fumio | Central Research Laboratory Hitachi Ltd
スポンサーリンク
概要
関連著者
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Nagata Fumio
Central Research Laboratory Hitachi Ltd
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Kakibayashi Hiroshi
Central Research Laboratory Hitachi Ltd
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KAKIBAYASHI Hiroshi
Central Research Laboratory, Hitachi, Ltd
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MATSUDA Tsuyoshi
Central Research Laboratory, Hitachi Ltd.
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Komoda Tsutomu
Central Research Laboratory, Hitachi Ltd.
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MATSUNAGA Fumiko
Central Research Laboratory, Hitachi, Ltd.
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Komoda Tsutomu
Central Research Laboratory Hitachi Ltd.
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Komoda Tsutomu
Central Research Lab. Hitachi Ltd.
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KATAYAMA Yoshifumi
Central Research Laboratory, Hitachi Ltd.
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Matsuda Tsuyoshi
Central Research Laboratory Hitachi Ltd.
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Shiraki Yasuhiro
Central Research Laboratory Hitachi Ltd.
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Ono Y
Central Research Laboratory Hitachi Ltd
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KAKIBAYASHI Hiroshi
The authors are with Central Research Laboratory, Hitachi Ltd.
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NAGATA Fumio
Central Research Laboratory, Hitachi Ltd.,
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Shimotsu Teruho
Central Research Laboratory Hitachi Ltd.
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Nagata F
Hitachi Instruments Engineering Co. Ltd. Tokyo Jpn
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Nagata Fumio
Central Research Laboratory Hitachi Ltd.
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ONO Yuichi
Central Research Laboratory, Hitachi, Ltd.
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ISHIKAWA Isao
Central Research Laboratory, Hitachi Ltd.
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Kakibayashi H
Hitachi Ltd. Tokyo Jpn
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Ishikawa Isao
Central Laboratory Hitachi Lid.
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Katayama Yoshifumi
Central Research Laboratory
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Matsunaga Fumiko
Central Research Laboratory Hitachi Ltd
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Ono Yuichi
Central Research Laboratory Hitachi Ltd.
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Shiraki Yasuhiro
Central Research Laboratory
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KOMODA Tsutomu
Central Research Laboratory, Hitachi Ltd.,
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MATSUDA Tsuyoshi
Central Research Laboratory, Hitachi Ltd.,
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KATAYAMA Yoshifumi
Central Research Laboratory, Hitachi, Ltd.
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NAGATA Fumio
Central Research Laboratory, Hitachi Ltd.
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Nagata Fumio
Central Research Laboratory, Hitachi, Ltd.
著作論文
- High Resolution Electron Microscopy by an Incoherent Illumination Method
- Observation of Fine Compositional Fluctuation in GaAs/AI_xGa_As Superstructure Using Composition Analysis by Thickness-Fringe (CAT) Method
- Observation of Incoherent Images through Minute Fluctuations of Lens Excitation Current
- Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_ As Multilayer Structure
- Simulation Studies of a Composition Analysis by Thickness-Fringe (CAT) in an Electron Microscope Image of GaAs/ Al_xGa_As Superstructure
- Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
- Depth Profiling of Superstructures by μ-AES Utilizing Angle-Lapped Specimens: Techniques, Instrumentations and Measurement
- Observation of Wet Biological Materials in a High Voltage Electron Microscope