Characterization of Grown-in Dislocations in Benzophenone Single Crystals by X-Ray Topography
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概要
- 論文の詳細を見る
Benzophenone single crystals were grown by the Czochralski method. The dislocations introduced during the crystal growth were examined using X-ray topography. Double images of single dislocations were found on the topographs taken in some reflection planes. The Burgers vector of predominant grown-in dislocations was estimated from analysis of the dislocation images on the basis kinematical theory.
- 社団法人応用物理学会の論文
- 1992-07-15
著者
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Kojima Kenzo
Department Of Electrical Engineering Aichi Institute Of Technology
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UEDONO Akira
Department of Industrial Chemistry, The University of Tokyo
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Kojima Kenzo
Department Of Electronic Engineering Faculty Of Engineering Aichi Institute Of Technology
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Uedono A
Univ. Tsukuba Tsukuba Jpn
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Kuroda Kenji
Faculty Of Engineering The University Of Tokushima
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Kojima Kenichi
Graduate School Of Integrated Science Yokohama City University
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Kojima Kenichi
Department Of Physics Yokohama City University
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Kojima Kenichi
Department Of Physics Faculty Of Sciences Tohoku University:faculty Of Integrated Arts And Sciences
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MOTOMURA Shigeki
Department of Chemotherapy, Kanagawa Cancer Center
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Kojima K
Department Of Electronic Engineering Faculty Of Engineering Aichi Institute Of Technology
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Kuroda K
Central Research Laboratory Hitachi Ltd.
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Kojima Kazuyoshi
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Tachibana Masaru
Department Of Physics Yokohama City University
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Uedono Akira
Department Of Industrial Chemistry Faculty Of Engineering University Of Tokyo
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TANG Qi
Graduate School of Integrated Science, Yokohama City University
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Tang Qi
Graduate School Of Integrated Science Yokohama City University:(present Address)shincron Co. Ltd.
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KURODA Keigo
Department of Materials Science, Faculty of Science, Hiroshima University
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Kojima Kenichi
Department Of Hematology Ogikubo Hospital
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Motomura Shigeki
Department Of Physics Yokohama City University:(present Address) The Furukawa Electric Co. Ltd. Yoko
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