Superstructure in Thin Films of Bi-Based Compounds on MgO

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概要

• 論文の詳細を見る

• In situ epitaxial growth of BiSrCaCuO films by three target sputtering was performed on MgO substrates at a temperature of 650℃. From high resolution transmission electron microscopy, the film showed a superstructure consisting of the alternate stacking of the low-T_c and high-T_c phases with a c-axis of 34 Å. The film in the [110] or [110] directions was parallel to <100>MgO, and the transient layers between the substrate and the film were less than a few atomic layers thick. X-ray diffraction simulations indicated that the films contained random layer ordering of 34 Å bi-layers (low-T_c+high-T_c and high-T_c+low-T_c) and random layer ordering of low-T_c and high-T_c phase layers.

• 社団法人応用物理学会の論文
• 1990-09-20

著者

• Kojima Kenzo

  Department Of Electrical Engineering Aichi Institute Of Technology

• Kojima Kenzo

  Department Of Electronic Engineering Faculty Of Engineering Aichi Institute Of Technology

• KOJIMA Kazuyoshi

  Central Research Laboratory, Mitsubishi Electric Corporation

• HAMANAKA Koichi

  Central Research Laboratory, Mitsubishi Electric Corporation

• Kuroda Kenji

  Faculty Of Engineering The University Of Tokushima

• Kojima Kenichi

  Graduate School Of Integrated Science Yokohama City University

• Kojima Kenichi

  Department Of Physics Yokohama City University

• Kojima K

  Department Of Electronic Engineering Faculty Of Engineering Aichi Institute Of Technology

• Kuroda K

  Central Research Laboratory Hitachi Ltd.

• TANIOKU Masami

  Central Research Laboratory, Mitsubishi Electric Corporation

• Tanioku Masami

  Central Research Laboratory Mitsubishi Electric Corporation

• Kojima Kazuyoshi

  Advanced Technology R&d Center Mitsubishi Electric Corporation

• Kojima Kazuyoshi

  Central Research Laboratory Mitsubishi Electric Corporation

• Eckstein James

  Varian Research Center

• Harris James

  Department Of Electrical Engineering Stanford University

• SCHLOM Darrell

  Department of Electrical Engineering, Stanford University

• HAMANAKA Kenjiro

  Tsukuba Research Laboratory, Nippon Sheet Glass Co., Ltd.

• Schlom Darrell

  Department Of Electrical Engineering Stanford University

• Hamanaka K

  Tsukuba Research Laboratory Nippon Sheet Glass Co. Ltd.

• Hamanaka Koichi

  Central Research Laboratory Mitsubishi Electric Corporation

• KURODA Keigo

  Department of Materials Science, Faculty of Science, Hiroshima University

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