Artificial Grain Boundary Junctions in BiSrCaCuO Thin Films with (11n) and (001) Orientation
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1992-03-01
著者
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Wada Osamu
Materials & Electronic Device Laboratory Mitsubishi Electric Corporation
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TANIMURA Junji
Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation
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KATAOKA Masayuki
Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation
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Kataoka M
Hokkaido Univ. Sapporo Jpn
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Wada O
The Department Of Electrical And Electronics Engineering Kobe University
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Wada Osamu
Materials And Structures Laboratory Tokyo Institute Of Technology
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OGAMA Tetsuo
Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation
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TAKAMI Tetsuya
Central Research Laboratory, Mitsubishi Electric Corporation
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KOJIMA Kazuyoshi
Central Research Laboratory, Mitsubishi Electric Corporation
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HAMANAKA Koichi
Central Research Laboratory, Mitsubishi Electric Corporation
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Wada O
The Femtosecond Technology Research Association:the Kobe University.
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Tanimura J
Mitsubishi Electric Corp. Hyogo Jpn
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Takami T
Mitsubishi Electric Corp. Hyogo Jpn
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Tanimura Junji
Materials And Electronic Devices Laboratory Mitsubishi Electric Corporation
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Kojima Kazuyoshi
Central Research Laboratory Mitsubishi Electric Corporation
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Ogama T
Mitsubishi Electric Corp. Hyogo Jpn
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Kuroda Ken'ichi
Advanced Technology R&d Center Mitsubishi Electric Corporation
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HAMANAKA Kenjiro
Tsukuba Research Laboratory, Nippon Sheet Glass Co., Ltd.
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Hamanaka K
Tsukuba Research Laboratory Nippon Sheet Glass Co. Ltd.
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Hamanaka Koichi
Central Research Laboratory Mitsubishi Electric Corporation
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Tanimura Junji
Materials and Electronic Device Laboratory, Mitsubishi Electric Corporation
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Ogama Tetsuo
Materials and Electronic Device Laboratory, Mitsubishi Electric Corporation
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