A Simultaneous RHEED/AES Combined System

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Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement
Photoluminescence Intensity in InGaAsP/InP Double-Heterostructures
X-Ray Reflectometry and Infrared Analysis of Native Oxides on Si(100) Formed in Chemical Treatment
Optimization of GaN Growth with Ga-Polarity by Referring to Surface Reconstruction Reflection High-Energy Electron Diffraction Patterns : Semiconductors
Essential Change in Crystal Qualities of GaN Films by Controlling Lattice Polarity in Molecular Beam Epitaxy
Influence of Mn Incorporation on Molecular Beam Epitaxial Growth of GaMnN Film :Surfaces, Interfaces, and Films
Studies of Photoluminescence Intensity in the InP/InGaAsP/InP Double Heterostructure
Growth of Droplet-Free AlGaN Buffer Layer with +c Polarity by Molecular Beam Epitaxy
Characterization of Polarity of Wurtzite GaN Film Grown by Molecular Beam Epitaxy Using NH_3
Analysis of Contamination Layer of InP During LPE Process by Synchrotron Radiation-Excited X-Ray Fluorescence : Surfaces, Interfaces and Films
Selectively Doped n-InAlAs/InP Heterostructures Grown by MOCVD
Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8
Auger Electron Emission from Gold Deposited on Silicon (111) Surface
Determination of the GaAs/AlAs Superlattice Period from the First-Order Superlattice Bragg Reflection
High-Density Layer at the SiO_2/Si Interface Observed by Difference X-Ray Reflectivity
High-Accuracy X-ray Reflectivity Study of Native Oxide Formed in Chemical Treatment
EBIC Observation on the InP/InGaAs/InP Heterostructure Photodiode
Admittance Study of a Single Electron Trap in the LPE InP/InGaAsP Heterostructure Diode
Transmission Electron Microscopic Observation of Misfit Dislocation in InP/InGaAsP Double -Heterostructures
Inhomogeneous Distribution of Avalanche Multiplication in InP APDs
Calculation of Impurity Concentrations in LPE InP Layers
Characterization of Polarity of Plasma-Assisted Molecular Beam Epitaxial GaN{0001}Film Using Coaxial Impact Collision Ion Scattering Spectroscopy
Computer Simulation for Analysis of Lattice Polarity of Wurtzite GaN{0001} Film by Coaxial Impact Collision Ion Scattering Spectroscopy
Terminating Structure of Plasma-Assisted Molecular Beam Epitaxial GaN{0001} Film Surface Identified by Coaxial Impact Collision Ion Scattering Spectroscopy
TEM Observation of Dark Defects Appearing in InGaAsP/InP Double-Heterostructure Light Emitting Diodes Aged at High Temperature
TEM Investigation of Dislocation Loops in Undoped InGaAsP and InGaP Layers Grown by Liquid Phase Epitaxy
Composition-Modulated Structures in InGaAsP and InGaP Liquid Phase Epitaxial Layers Grown on (001) GaAs Substrates
Comparison of Defect Formation in InGaAsP/InP and GaAlAs/GaAs : B-2: LD AND LED-1
A Molecular and Jon-Beam Epitaxy System for the Growth of III-V Compound Semiconductors Using a Mass-Separated, Low-Energy Group-V Jon Beam
Molecular Beam Epitaxy of InP Using Low Energy P^+ Ion Beam
Epitaxial Growth of α-Fe Film on Si(111) Substrate by Low-Energy Direct Ion Beam Deposition
Low-Temperature Silicon Epitaxial Growth by Photochemical Vapor Deposition Using Vacuum Ultraviolet Light
EXAFS Study of Cation Sites in In-thiospinel Compound FeIn_2S_4
Dependence of Rocking Curve for Thin In_Ga_xAs_P_y Layer on Thickness in a Symmetric Bragg Case
Effect of an InP Buffer Layer on Photoluminescence Efficiency of an InGaAsP Layer
Thermal Degradation of InP/InGaAsP/InP DH Structure
Life Test of GaAs DH Lasers at Room Temperature
Suppression of the Phase Transition to C54 TiSi_2 due to Epitaxial Growth of C49 TiSi_2 on Si(001) Substrates in Silicidation Process
Grazing Incidence X-Ray Diffraction Study on Effect of Implanted BF^+_2 and Linewidth on Titanium Silicidation
Transmission Electron Microscopy Observation of CoSi_x Spikes in Si Substrates during Co-silicidation Process
Fine Adjustment Based on Model for X-Ray Absorption Fine Structure of Ni-Fe Alloy
A Simultaneous RHEED/AES Combined System
Photo-Ionizalion Assisted Photo-CVD of Silicon Nitride Film by Microwave-Excited Deuterium Lamp
A Simple Ion Energy Analyser Equipped with a Quadrupole Mass Spectrometer
Observations of C_mF_n Radicals in Reactive Ion Beam Etching
UHV-IMMA Development and Application to Hydrogen Detection
Stabilization of the Discharge in Sputter-Ion Pumps
Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement

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