Fine Adjustment Based on Model for X-Ray Absorption Fine Structure of Ni-Fe Alloy
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概要
- 論文の詳細を見る
To increase the reliability of the structural parameters, the FABM has been applied to the best fit data obtained from two kinds of Ni-Fe films. The sputtered sample is closer to the crystalline Ni_3Fe than the plated one, which becomes consistent with an interpretation of the X-ray diffraction data. This shows that the FABM is very useful for correcting the BFBT results.
- 社団法人応用物理学会の論文
- 1992-08-15
著者
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Komiya S
Fujitsu Laboratories Ltd.
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Komiya Satoshi
Fujitsu Laboratories Lid.
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Komiya S
Fujitsu Lab. Ltd. Atsugi Jpn
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TANIDA Yoshiaki
Fujitsu Laboratories Ltd.
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