サブミクロン二次イオン質量分析装置を用いるチタン添加極低炭素鋼中の非金属介在物粒子のキャラクタリゼーション(<特集>質量分析法の応用技術)

概要

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Nonmetallic inclusions unfavorably influence the quality of steel but their origin and generation process are not yet understood. The development of methods for the characterization of each inclusion particle is required. By employing a gallium focused ion beam (Ga^+ -FIB) as the primary ion beam in secondary ion mass spectrometry (SIMS), particle analysis with high spatial resolution is easily achieved. We analyzed individual nonmetallic inclusion particles in Al-deoxidized and Ti-denitrified low carbon steel (Interstitial atom-Free steel : IF steel) by electron probe microanalysis (EPMA) and submicron SIMS. From the EPMA measurements followed by cluster analysis, the inclusion particles were classified into 3 clusters. We carried out shave-off analysis for the typical particle in each cluster. From the shave-off profile, the composition and inner elemental distribution were obtained. From these analyses, the generation process of nonmetallic inclusions in IF steel was clarified.
社団法人日本分析化学会の論文
1996-06-05