電子プローブマイクロアナリシス法及び二次イオン質量分析法による大気浮遊粒子状物質の同一粒子分析(<特集>質量分析法の応用技術)

概要

論文の詳細を見る
In the source apportionment of suspended particulate matter (SPM), not only the average composition, but also the compositional distribution within an SPM particle is important. However, it is difficult to obtain both kinds of data with one analytical technique. Electron probe microanalysis (EPMA) is suitable for average compositional analysis, while gallium focused ion beam secondary ion mass spectrometry (Ga FIB SIMS) gives us the compositional distribution of a particle. Therefore, the combination of EPMA and Ga FIB SIMS is desirable for obtaining detailed information on a particle. However, two problems must be overcome to make this combination practicable : avoidance of charge-up and identification of the same particle in separate microscopic fields. We proposed a procedure to overcome these problems by using a Ag membrane filter and Au index grid. This procedure was applied to the analysis of SPM particles collected near a traffic road. As a result, mineral origin particles in addition to a lot of soot were found in EPMA analysis, and Ga FIB SIMS clearly showed the existence of minor elements and their compositional distribution on the single particle level.
社団法人日本分析化学会の論文
1996-06-05