A 0.15-μm FD-SOI Substrate Bias Control SRAM with Inter-Die Variability Compensation Scheme

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概要

• 論文の詳細を見る
• 2012-04-01

著者

• Yoshimoto Masahiko

  Mitsubishi Electric Corporation

• Kawaguchi Hiroshi

  Kobe Univ. Kobe‐shi Jpn

• YOSHIMOTO Masahiko

  Kobe University

• FUJIWARA Hidehiro

  Kobe University

• OKUMURA Shunsuke

  Kobe University

• MORITA Yasuhiro

  Kobe University

• Kawaguchi Hiroshi

  Department Of Computer Science And Systems Engineering Kobe University

• Yoshimoto Masahiko

  System Lsi Development Center Mitsubishi Electric Corporation

• Yoshimoto M

  Department Of Computer Science And Systems Engineering Kobe University

• FUJIWARA Hidehiro

  the Graduate School of Science and Technology, Kobe University

• YOSHIMOTO Shusuke

  Kobe University

• YAMAGUCHI Kosuke

  Kobe University

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