FUJIWARA Hidehiro | the Graduate School of Science and Technology, Kobe University
スポンサーリンク
概要
関連著者
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Yoshimoto Masahiko
Mitsubishi Electric Corporation
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Kawaguchi Hiroshi
Kobe Univ. Kobe‐shi Jpn
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MORITA Yasuhiro
Kobe University
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Kawaguchi Hiroshi
Department Of Computer Science And Systems Engineering Kobe University
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Yoshimoto Masahiko
System Lsi Development Center Mitsubishi Electric Corporation
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Yoshimoto M
Department Of Computer Science And Systems Engineering Kobe University
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FUJIWARA Hidehiro
the Graduate School of Science and Technology, Kobe University
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FUJIWARA Hidehiro
Kobe University
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Noguchi Hiroki
Kobe University
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Morita Yasuhiro
Department Of Computer Science And Systems Engineering Kobe University
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YOSHIMOTO Masahiko
Kobe University
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Yoshimoto Masahiko
Department Of Computer Science And Systems Engineering Kobe University
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Iguchi Yusuke
Kobe Univ. Kobe‐shi Jpn
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Nii Koji
Kobe University:renesas Technology Corporation
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Nii Koji
Kobe University
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OKUMURA Shunsuke
Kobe University
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KAWAGUCHI Hiroshi
Department of Orthopaedic Surgery, The University of Tokyo
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Fujiwara Hidehiro
Graduate School of Engineering, Kobe University
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YOSHIMOTO Masahiko
Department of Computer Science and Systems Engineering, Kobe University
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Noguchi Hiroki
Department Of Physiological Anthropology Kyushu University Of Design Sciences
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MIYAKOSHI Junichi
Kobe University
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Ohta Chikara
Department Of Computer Science And Systems Engineering Kobe University
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Kawaguchi Hiroshi
Department Of Chemistry Faculty Of Science Kochi University
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Morita Yasuhiro
Graduate School Of Natural Science And Technology Kanazawa University
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MIKAMI Shinji
Graduate School of Science and Technology, Kobe University
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KAWAKAMI Kentaro
Graduate School of Science and Technology, Kobe University
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MIYAKOSHI Junichi
Graduate School of Science and Technology, Kobe University
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Mikami Shinji
Graduate School Of Science And Technology Kobe University
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Izumi Shintaro
Department Of Computer Science And Systems Engineering Kobe University
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NII Koji
Graduate School of Science and Technology, Kobe University
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Sakai Yasuharu
Department Of Computer Science And Systems Engineering Kobe University
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Kawakami Kentaro
Graduate School Of Science And Technology Kobe University
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Morita Yasuhiro
Graduate School Of Engineering Osaka University
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Matsuda Takashi
Department Of Computer Science And Systems Engineering Kobe University
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Takeuchi Takashi
Department Of Computer Science And Systems Engineering Kobe University
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Kawaguchi Hiroshi
Department Of Applied Chemistry Faculty Of Engineering Utsunomiya University
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Kawaguchi Hiroshi
The Graduate School Of Science And Technology Kobe University
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MATSUDA Takashi
the Graduate School of Science and Technology, Kobe University
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IZUMI Shintaro
the Graduate School of Science and Technology, Kobe University
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SAKAI Yasuharu
the Graduate School of Science and Technology, Kobe University
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TAKEUCHI Takashi
the Graduate School of Science and Technology, Kobe University
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OHTA Chikara
the Graduate School of Science and Technology, Kobe University
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YOSHIMOTO Masahiko
the Graduate School of Science and Technology, Kobe University
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YOSHIMOTO Shusuke
Kobe University
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Fujiwara Hidehiro
The Graduate School Of Science And Technology Kobe University
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Ohta Chikara
The Graduate School Of Science And Technology Kobe University
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YAMAGUCHI Kosuke
Kobe University
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Matsuda Takashi
The Graduate School Of Science And Technology Kobe University
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Takeuchi Takashi
The Graduate School Of Science And Technology Kobe University
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Izumi Shintaro
The Graduate School Of Science And Technology Kobe University
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NOGUCHI Hiroki
Department of Emergency and Critical Care Medicine, Aichi Medical University Hospital
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Yoshimoto Masahiko
Department of Computer and Systems Engineering, Kobe University
著作論文
- A Dependable SRAM with 7T/14T Memory Cells
- A 10T Non-precharge Two-Port SRAM Reducing Readout Power for Video Processing
- Area Comparison between 6T and 8T SRAM Cells in Dual-V_ Scheme and DVS Scheme(Memory Design and Test,VLSI Design and CAD Algorithms)
- Area Optimization in 6T and 8T SRAM Cells Considering V_ Variation in Future Processes(Next-Generation Memory for SoC,VLSI Technology toward Frontiers of New Market)
- A 0.3-V operating, Vth-variation-tolerant SRAM under DVS environment for memory-rich SoC in 90-nm technology era and beyond
- Divided Static Random Access Memory for Data Aggregation in Wireless Sensor Nodes
- A 0.15-μm FD-SOI Substrate Bias Control SRAM with Inter-Die Variability Compensation Scheme