Connection Test of Area Bump Using Active-Matrix Switches
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概要
- 論文の詳細を見る
- 2004-09-15
著者
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HASEGAWA Satoshi
Center for Interdisciplinary Research, Tohoku University
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Asano Tanemasa
Center For Microelectronic Systems Kyushu Institute Of Technology
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Watanabe Naoya
Center For Microelectronic Systems Kyushu Institute Of Technology
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Asano Tanemasa
Kyushu Inst. Of Technol. Fukuoka Jpn
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Hasegawa Satoshi
Center For Interdisciplinary Research Tohoku University
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Hasegawa Satoshi
Center For Microelectronic Systems Kyushu Institute Of Technology
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