Suppressing Plasma Induced Degradation of Gate Oxide by Using Silicon-On-Insulator Structures
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概要
- 論文の詳細を見る
- 1997-09-16
著者
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Asano Tanemasa
Center For Microelectronic Systems Kyushu Institute Of Technology
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Asano Tanemasa
Center For Microelectronics Systems Kyushu Institute Of Technology
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ARITA Kiyoshi
Center for Microelectronics Systems, Kyushu Institute of Technology
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AKAMATSU Masashi
Center for Microelectronics Systems, Kyushu Institute of Technology
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Arita K
Waseda Univ. Tokyo Jpn
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Arita Kiyoshi
Center For Microelectronic Systems Kyushu Institute Of Technology
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Akamatsu M
Research And Development Center Stanley Electric Co. Ltd.
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Akamatsu Masashi
Center for Microelectronic Systems, Kyushu Institute of Technology
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