SHIRAKASHI Jun-ichi | Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technology
スポンサーリンク
概要
- 同名の論文著者
- Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technologyの論文著者
関連著者
-
SHIRAKASHI Jun-ichi
Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technology
-
Shirakashi Junichi
Electrotechnical Laboratory
-
Shirakashi Jun-ichi
Electrotechnical Laboratory
-
Matsumoto Kazuhiko
Electrotechnical Laboratory
-
Matsumoto K
Electrotechnical Lab. Ibaraki‐kenn Jpn
-
Matsumoto Kazuhiko
Electrotechnical Laboratory (etl)
-
Matsumoto Kazuhiko
Advanced Industrial Science And Technology:tsukuba University:crest
-
Konagai Makoto
Department Of Electrical And Electronic Engineering. Tokyo Institute Of Technology
-
Miura Naruhisa
Advanced Technology R&d Center Mitsubishi Electric Corporation
-
Matsumoto Kazuhiko
Electrotechnical Laboratory (elt)
-
Matsumoto Kazuhisa
Sumitomo Electric Industries Ltd.
-
Konagai M
Department Of Physical Electronics Tokyo Institute Of Technology
-
Miura N
Advanced Technology R&d Center Mitsubishi Electric Corporation
-
MIURA Naruhisa
Tokyo Institute of Technology
-
Konagai Makoto
Tokyo Inst. Technol. Tokyo Jpn
-
KONAGAI Makoto
Tokyo Institute of Technology
-
Miura N
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
-
Matsumoto K
Nippon Sanso Corp. Ibaraki Jpn
-
Matsumoto K
Advanced Industrial Science And Technology:tsukuba University:crest
-
Matsumoto Koh
Tsukuba Laboratories Nippon Sanso Corporation
-
Matsumoto K
Electrotechnical Laboratory
-
ISHII Makoto
Optoelectronics Joint Research Laboratory
-
Ishii Masami
Electrotechnical Laboratory
-
Ishii M
Electrotechnical Laboratory
-
Ishii M
Optoelectronics Joint Research Laboratory
-
Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
-
Ishii M
Liquid Crystal Lab. Sharp Corp.
-
TAKEMURA Yasushi
Electrical and Computer Engineering, Yokohama National University
-
Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
-
Ishii M
Shonan Inst. Technol. Kanagawa Jpn
-
Takemura Yasushi
Electrical And Computer Engineering Yokohama National University
-
YAMADA Akira
Departments of Immunology, Kurume University School of Medicine
-
Suzuki Y
Showa Shell Sekiyu K.k. Kanagawa
-
山田 晃
東京農工大学生物システム応用科学府
-
KONAGAI Makoto
Department of Physical Electronics, Tokyo Institute of Technology
-
BALAKRISHNAN K.
静岡大
-
Balakrishnan K.
静岡大学電子工学研究所
-
Yamada Akira
Department Of Cardiology Aso-iizuka Hospital
-
Balakrishnan Krishnan
名城大学理工学部材料機能工学科
-
Suzuki Y
Hitachi Ltd. Tokyo Jpn
-
Harris James
Stanford University Stanford
-
Suzuki Y
Optoelectronic Division Electrotechnical Laboratory
-
K バラクリシュナン
静岡大学電子工学研究所
-
OKUMURA Hajime
Electrotechnical Laboratory (ETL)
-
SONODA Saki
ULVAC JAPAN, Ltd,
-
SHIMIZU Saburo
ULVAC JAPAN, Ltd
-
Okumura H
National Inst. Advanced Industrial Sci. And Technol. Ibaraki Jpn
-
Okumura H
Electrotechnical Lab. Ibaraki Jpn
-
Okumura H
Neutron Scattering Laboratory Issp The University Of Tokyo
-
Okumura Hajime
Electrotechnical Laboratory
-
Balakrishnan Krishnan
Electrotechnical Laboratory
-
SUZUKI Yoshifumi
NTT Electrical Communications Laboratories
-
Suzuki Yoshiichi
Central Research And Development Laboratory Showa Shell Sekiyu K.k.
-
Suzuki Yoshifumi
Department Of Materials Science Faculty Of Engineering Kyushu Institute Of Technology
-
Suzuki Yoshishige
Joint Research Center For Atom Technology(jrcat)-national Institute For Advanced Interdisciplinary R
-
Suzuki Yasuzou
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology
-
Sonoda S
Lvac Inc.
-
Sonoda Saki
Ulvac Inc.
-
Harris James
Stanford University Department Of Electrical Engineering
-
Okunuma H
National Institute Of Advanced Industrial Science And Technology
-
Shimizu S
R&d Association Of Future Electron Devices C/o National Institute Of Advanced Industrial Science
-
Shimizu Saburo
Ulvac Corporation
-
MIURA Naruhisa
Department of Electrical and Electronic Engineering, Tokyo Institute of Teclnohogy
-
Shirakashi Jun-ichi
Electronics And Information System Akita Prefectural University
-
SUZUKI Yasumasa
ULVAC JAPAN, Ltd.
-
NUMAGUCHI Tetsuyuki
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology
-
Konagai Makoto
Department Of Electrical & Electronic Engineering Tokyo Institute Of Technology
-
Numaguchi Tetsuyuki
Department Of Electrical And Electronic Engineering Tokyo Institute Of Technology
-
Shimizu Masahiro
Ulsi Development Center Mitsubishi Electric Corporation
-
GOTOH Yasuhito
Department of Electronic Science and Engineering, Kyoto University
-
Gotoh Y
Tsukuba Univ. Ibaraki Jpn
-
Maeda T
Advanced Industrial Sci. And Technol. Ibaraki Jpn
-
Maeda T
Central Research Laboratory Hitachi Ltd.
-
Yamada Tsutomu
Department Of Electrical And Computer Engineering Yokohama National University
-
MAEDA Tatsuro
Electron Devices Division, Electrotechnical Laboratory
-
Shimizu M
Advanced Industrial Science And Technology (aist) Power Electronics Research Center
-
Shimizu Mitsuaki
Power Electronics Research Center National Institute Of Advanced Industrial Science And Technology
-
HAYASHI Satomi
Electrical and Computer Engineering, Yokohama National University
-
OKAZAKI Fuminori
Electrical and Computer Engineering, Yokohama National University
-
YAMADA Tsutomu
Electrical and Computer Engineering, Yokohama National University
-
Maeda T
Electron Devices Division Electrotechnical Laboratory
-
Gotoh Yasuhito
Department Of Electronic Science And Engineering Kyoto University
-
VARTANIAN Bartev
Stanford University
-
Gotoh Yoshikazu
Information Equipment Research Laboratory
-
GOTOH Yoshitaka
Electrotechnical Laboratory MITI
-
Hayashi Satomi
Electrical And Computer Engineering Yokohama National University
-
Shirakashi Jun‐ichi
Department Of Electrical And Electronic System Engineering Tokyo University Of Agriculture And Techn
-
NISHIHARA Takaharu
Shimadzu Corporation
-
SHINOHARA Makoto
Shimadzu Corporation
-
Nishihara T
Av Core Technology Development Center Matsushita Electric Industrial Co. Ltd.
-
Shinohara M
Shimadzu Corporation
-
Gotoh Yoshitaka
Electrotechnical Laboratory
-
Yasushi Takemura
Department Of Electrical And Computer Engineering Yokohama National University
-
Nishihara Takashi
Optical Disk Systems Development Center Matsushita Electric Industrial Co. Ltd.
-
Takemura Yasushi
Electrical And Computer Engineering Yokohama University
-
Okazaki Fuminori
Electrical And Computer Engineering Yokohama National University
-
SHIRAKASHI Jun-ichi
Electronics and Information System, Akita Prefectural University
-
Miura Naruhisa
Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152, Japan
-
Konagai Makoto
Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152, Japan
-
Shirakashi Jun-ichi
Electrotechnical Laboratory (ETL), 1-1-4 Umezono, Tsukuba-shi, Ibaraki 305, Japan
著作論文
- Direct Modification of Magnetic Domains in Co Nanostructures by Atomic Force Microscope Lithography
- Surface Modification of Niobium (Nb) by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Fabrication and Characterization of Nb/Nb Oxides-Based Single Electron Transistors (SETs)
- Side Gate Single Electron Transistor with Multi-Islands Structure Operated at Room Temperature Made by STM/AFM Nano-Oxidation Process
- Single Electron Transistor on Atomically Flat α-Al_2O_3 Substrate Made by AFM Nano-Oxidation Process
- Room Temperature Nb-Based Single-Electron Transistors
- Room Temperature Nb-Based Single-Electron Transistors
- Single-Electron Transistors (SETs) with Nb/Nb Oxide System Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Nb/Nb Oxide-based Planar-Type Metal/Insulator/Metal (MIM) Diodes Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process
- Planer-type Ferromagnetic Tunnel Junctions Fabricated by Atomic Force Microscope for Nonvolatile Memory
- Characterization of Polarity of Plasma-Assisted Molecular Beam Epitaxial GaN{0001}Film Using Coaxial Impact Collision Ion Scattering Spectroscopy
- Computer Simulation for Analysis of Lattice Polarity of Wurtzite GaN{0001} Film by Coaxial Impact Collision Ion Scattering Spectroscopy
- Room Temperature Operation of Amorphous Carbon-Based Single-Electron Transistors Fabricated by Beam-Induced Deposition Techniques
- Single-Electron Tunneling through Amorphous Carbon Dots Array
- NiFe-Based Nanostructures Fabricated Using an Atomic Force Microscope
- Room Temperature Nb-Based Single-Electron Transistors