Nb/Nb Oxide-based Planar-Type Metal/Insulator/Metal (MIM) Diodes Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-08-15
著者
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KONAGAI Makoto
Tokyo Institute of Technology
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Miura N
Department Of Materials Science And Technology Graduate School Of Engineering Sciences Kyushu Univer
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Matsumoto K
Nippon Sanso Corp. Ibaraki Jpn
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Matsumoto K
Electrotechnical Lab. Ibaraki‐kenn Jpn
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Matsumoto Kazuhiko
Electrotechnical Laboratory (etl)
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Matsumoto Kazuhiko
Advanced Industrial Science And Technology:tsukuba University:crest
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SHIRAKASHI Jun-ichi
Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technology
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Konagai Makoto
Department Of Electrical And Electronic Engineering. Tokyo Institute Of Technology
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MIURA Naruhisa
Tokyo Institute of Technology
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Miura Naruhisa
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Matsumoto Kazuhiko
Electrotechnical Laboratory (elt)
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Matsumoto Kazuhisa
Sumitomo Electric Industries Ltd.
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Konagai Makoto
Tokyo Inst. Technol. Tokyo Jpn
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Konagai M
Department Of Physical Electronics Tokyo Institute Of Technology
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Matsumoto K
Advanced Industrial Science And Technology:tsukuba University:crest
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Miura N
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Matsumoto Koh
Tsukuba Laboratories Nippon Sanso Corporation
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Shirakashi Junichi
Electrotechnical Laboratory
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Shirakashi Jun-ichi
Electrotechnical Laboratory
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Matsumoto K
Electrotechnical Laboratory
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Matsumoto Kazuhiko
Electrotechnical Laboratory
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