Surface Modification of Niobium (Nb) by Atomic Force Microscope (AFM) Nano-Oxidation Process
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-11-15
著者
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KONAGAI Makoto
Tokyo Institute of Technology
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ISHII Makoto
Optoelectronics Joint Research Laboratory
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Ishii Masami
Electrotechnical Laboratory
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Ishii M
Electrotechnical Laboratory
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Ishii M
Optoelectronics Joint Research Laboratory
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Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
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Matsumoto K
Nippon Sanso Corp. Ibaraki Jpn
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Matsumoto K
Electrotechnical Lab. Ibaraki‐kenn Jpn
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Matsumoto Kazuhiko
Electrotechnical Laboratory (etl)
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Matsumoto Kazuhiko
Advanced Industrial Science And Technology:tsukuba University:crest
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Ishii M
Liquid Crystal Lab. Sharp Corp.
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SHIRAKASHI Jun-ichi
Electrical and Electronic System Engineering, Tokyo University of Agriculture and Technology
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Konagai Makoto
Department Of Electrical And Electronic Engineering. Tokyo Institute Of Technology
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MIURA Naruhisa
Tokyo Institute of Technology
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Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
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Miura Naruhisa
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Matsumoto Kazuhiko
Electrotechnical Laboratory (elt)
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Matsumoto Kazuhisa
Sumitomo Electric Industries Ltd.
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Konagai Makoto
Tokyo Inst. Technol. Tokyo Jpn
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Konagai M
Department Of Physical Electronics Tokyo Institute Of Technology
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Matsumoto K
Advanced Industrial Science And Technology:tsukuba University:crest
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Miura N
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Ishii M
Shonan Inst. Technol. Kanagawa Jpn
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Shirakashi Junichi
Electrotechnical Laboratory
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Shirakashi Jun-ichi
Electrotechnical Laboratory
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Matsumoto Kazuhiko
Electrotechnical Laboratory
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