XANES Analysis of Optical Activation Process of Er in Si:Er2O3 Thin Film:Electronic and Structural Modifications around Er (Proceedings of the Second International Conference on SRMS(Synchrotron Radiation in Materials Science)(2))
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
著者
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ISHII Makoto
Optoelectronics Joint Research Laboratory
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Morikawa T
Toyo Univ. Saitama Jpn
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Morikawa T
Communications Res. Lab. Tokyo Jpn
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Ishii M
Electrotechnical Laboratory
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Ishii M
Optoelectronics Joint Research Laboratory
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Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
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Ishii M
Liquid Crystal Lab. Sharp Corp.
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Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
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Morikawa Takeshi
Toyota Central R & D Laboratories Inc.
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Ishii M
Shonan Inst. Technol. Kanagawa Jpn
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