Breakdown Characteristics of SF_6 Gap Disturbed by a Metallic Protrusion under Oscillating Transient Overvoltages
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-04-15
著者
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ISHII Makoto
Optoelectronics Joint Research Laboratory
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Lee B‐h
Inha Univ. Inchon Kor
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Ishii M
Electrotechnical Laboratory
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Ishii M
Optoelectronics Joint Research Laboratory
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Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
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KAWAMURA Tatsuo
Department of Electrical Engineering, Shibaura Institute of Technology
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LEE Bok-Hee
Department of Electrical Engineering, Faculty of Engineering, Inha University
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NISHIMURA Takahiko
Institute of Industrial Science, University of Tokyo
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ISHII Masaru
Institute of Industrial Science, University of Tokyo
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Ishii M
Liquid Crystal Lab. Sharp Corp.
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Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
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Kawamura Tatsuo
Department Of Electrical Engineering Shibaura Institute Of Technology
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Kawamura T
Department Of Mathematics And Physics University Of Yamanashi
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Ishii M
Shonan Inst. Technol. Kanagawa Jpn
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Kawamura Takao
Laboratory Of Plant Physiology Graduate School Of Agriculture Kyoto University:(present Address)sumi
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Lee Bok-hee
Department Of Electrical Engineering Inha University
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Nishimura Takahiko
Institute Of Industrial Science University Of Tokyo:(present Address)osaka Signalling & Telecomm
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Ishii Masaru
Institute Of Industrial Science The University Of Tokyo
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