V-t Characteristics of SF6 Gap Disturbed by a Needle-Shaped Protrusion under Oscillating Transient Overvoltages
スポンサーリンク
概要
著者
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ISHII Makoto
Optoelectronics Joint Research Laboratory
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Lee B‐h
Inha Univ. Inchon Kor
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Ishii M
Electrotechnical Laboratory
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Ishii M
Optoelectronics Joint Research Laboratory
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Ishii M
Toyota Central Res. And Dev. Lab. Inc. Aichi Jpn
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Ishii M
Liquid Crystal Lab. Sharp Corp.
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Ishii M
Central Research Laboratory Nihon Cement Co. Lid.
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Kawamura Tatsuo
Department Of Electrical Engineering Shibaura Institute Of Technology
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Kawamura T
Department Of Mathematics And Physics University Of Yamanashi
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Ishii M
Shonan Inst. Technol. Kanagawa Jpn
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Kawamura Takao
Laboratory Of Plant Physiology Graduate School Of Agriculture Kyoto University:(present Address)sumi
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